LEADER 01377nam 2200397 450 001 9910291758803321 005 20230814225044.0 010 $a1-58537-302-8 035 $a(CKB)4100000007106633 035 $a(WaSeSS)IndRDA00121567 035 $a(EXLCZ)994100000007106633 100 $a20200407d2018 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$a2018 40th Electrical Overstress/Electrostatic Discharge Symposium $e23-28 September 2018, Reno, NV, USA /$fIEEE Electron Devices Society, IEEE Reliability Society 210 1$aPiscataway, New Jersey :$cInstitute of Electrical and Electronics Engineers,$d2018. 215 $a1 online resource (69 pages) 311 $a1-5386-7409-2 606 $aElectronic apparatus and appliances$xProtection$vCongresses 606 $aElectric discharges$vCongresses 606 $aElectrostatics$vCongresses 615 0$aElectronic apparatus and appliances$xProtection 615 0$aElectric discharges 615 0$aElectrostatics 676 $a621.381 712 02$aIEEE Electron Devices Society, 712 02$aIEEE Reliability Society, 801 0$bWaSeSS 801 1$bWaSeSS 906 $aPROCEEDING 912 $a9910291758803321 996 $a2018 40th Electrical Overstress$92509428 997 $aUNINA