LEADER 01368nam  2200373   450 
001 9910287958003321
005 20230814224556.0
010   $a1-5386-5992-1
035   $a(CKB)4100000006937886
035   $a(WaSeSS)IndRDA00121931
035   $a(EXLCZ)994100000006937886
100   $a20200416d2018      uy             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$a2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design $e2-4 July 2018, Platja d'Aro, Spain /$fInstitute of Electrical and Electronics Engineers
210  1$aPiscataway, New Jersey :$cInstitute of Electrical and Electronics Engineers,$d2018.
215   $a1 online resource (78 pages)
311   $a1-5386-5993-X 
606   $aError-correcting codes (Information theory)$vCongresses
606   $aElectronic circuit design$vCongresses
606   $aOnline data processing$vCongresses
615  0$aError-correcting codes (Information theory)
615  0$aElectronic circuit design
615  0$aOnline data processing
676   $a005.72
801  0$bWaSeSS
801  1$bWaSeSS
906   $aPROCEEDING
912   $a9910287958003321
996   $a2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design$92506535
997   $aUNINA