LEADER 02161nam 2200589 450 001 9910270916903321 005 20180119055719.0 010 $a1-118-70715-X 010 $a1-118-70712-5 010 $a1-118-70714-1 035 $a(CKB)3710000000894718 035 $a(PQKBManifestationID)16521834 035 $a(PQKBWorkID)15049317 035 $a(PQKB)23995154 035 $a(MiAaPQ)EBC4714697 035 $a(DLC) 2016033086 035 $a(EXLCZ)993710000000894718 100 $a20170104h20172017 uy 0 101 0 $aeng 135 $aurcnu|||||||| 181 $ctxt 182 $cc 183 $acr 200 10$aESD testing $efrom components to systems /$fSteven H. Voldman 210 1$aChichester, West Sussex, England :$cWiley,$d2017. 210 4$dİ2017 215 $a1 online resource (324 pages) $cillustrations 225 0 $aESD series 300 $aBibliographic Level Mode of Issuance: Monograph 311 $a0-470-51191-5 320 $aIncludes bibliographical references at the end of each chapters and index. 327 $aHuman body model -- Machine model -- Charged device model -- Transmission line pulse (TLP) -- Very fast transmission line pulse (VF-TLP) -- IEC 61000-4-2 -- Human metal model (HMM) -- IEC 61000-4-5 -- Cable discharge event (CDE) -- Latchup -- Electrical overstress (EOS) -- Electromagnetic compatibility (EMC) testing. 606 $aElectronic circuits$xEffect of radiation on 606 $aElectronic apparatus and appliances$xTesting 606 $aElectric discharges$xDetection 606 $aElectric discharges$xMeasurement 606 $aElectrostatics 608 $aElectronic books. 615 0$aElectronic circuits$xEffect of radiation on. 615 0$aElectronic apparatus and appliances$xTesting. 615 0$aElectric discharges$xDetection. 615 0$aElectric discharges$xMeasurement. 615 0$aElectrostatics. 676 $a621.3815/4 700 $aVoldman$b Steven H.$0872423 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910270916903321 996 $aESD testing$92781095 997 $aUNINA