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100   $a20121227d1999      u|         0
101 0 $aeng
135   $aurnn|008mamaa
181   $ctxt
182   $cc
183   $acr
200 10$aX-Ray and Neutron Reflectivity: Principles and Applications /$fby Jean Daillant, Alain Gibaud
205   $a1st ed. 1999.
210  1$aBerlin, Heidelberg :$cSpringer Berlin Heidelberg :$cImprint: Springer,$d1999.
215   $a1 online resource (XXIII, 331 p.) 
225 1 $aLecture Notes in Physics Monographs ;$v58
300   $aBibliographic Level Mode of Issuance: Monograph
311 08$a3-662-14250-3 
311 08$a3-540-66195-6 
320   $aIncludes bibliographical references and index.
327   $aPrinciples -- The Interaction of X-rays (and Neutrons) with Matter -- Statistical Aspects of Wave Scattering at Rough Surfaces -- Specular Reflectivity from Smooth and Rough Surfaces -- Diffuse Scattering -- Neutron Reflectometry -- Applications -- Statistical Physics at Crystal Surfaces -- Experiments on Solid Surfaces -- X-ray Reflectivity by Rough Multilayers -- Reflectivity of Liquid Surfaces and Interfaces -- polymer Studies.
330   $aThe book is the first comprehensive introduction to x-ray and neutron reflectivity techniques and illustrates them with many examples. After a pedagogical introduction, the interplay between the statistics of rough surfaces and interfaces and the scattering of radiation is considered in detail. Specular reflectivity and diffuse scattering are discussed next. The approximations are rigorously introduced and many experimental effects are discussed. In the case of neutron reflectivity, particular attention is paid to the reflectivity of polarized neutrons from magnetic multilayers, which allows the determination of in-plane magnetization profiles. Many applications are reviewed in the second part: rough surfaces, interfaces and multilayers, liquid surfaces and soft-condensed matter, and thin polymer films. In each case the underlying physics is first introduced, then specific experimental methods are described. The book addresses researchers and graduate students.
410  0$aLecture Notes in Physics Monographs ;$v58
606   $aCondensed matter
606   $aSpectrum analysis
606   $aSurfaces (Technology)
606   $aThin films
606   $aParticle accelerators
606   $aCondensed Matter Physics
606   $aSpectroscopy
606   $aSurfaces, Interfaces and Thin Film
606   $aAccelerator Physics
615  0$aCondensed matter.
615  0$aSpectrum analysis.
615  0$aSurfaces (Technology)
615  0$aThin films.
615  0$aParticle accelerators.
615 14$aCondensed Matter Physics.
615 24$aSpectroscopy.
615 24$aSurfaces, Interfaces and Thin Film.
615 24$aAccelerator Physics.
676   $a530.41
700   $aDaillant$b Jean$062269
702   $aGibaud$b Alain$f1956-
801  0$bMiAaPQ
801  1$bMiAaPQ
801  2$bMiAaPQ
906   $aBOOK
912   $a9910257443803321
996   $aX-ray and neutron reflectivity, principles and applications$91478068
997   $aUNINA