LEADER 03466nam  22006495  450 
001 9910254345303321
005 20200630214529.0
010   $a981-10-2269-0
024 7 $a10.1007/978-981-10-2269-2
035   $a(CKB)3710000000837568
035   $a(EBL)4660879
035   $a(DE-He213)978-981-10-2269-2
035   $a(MiAaPQ)EBC4660879
035   $a(PPN)194805409
035   $a(EXLCZ)993710000000837568
100   $a20160829d2017      u|         0
101 0 $aeng
135   $aur|n|---|||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aEM Wave Propagation Analysis in Plasma Covered Radar Absorbing Material /$fby Hema Singh, Simy Antony, Harish Singh Rawat
205   $a1st ed. 2017.
210  1$aSingapore :$cSpringer Singapore :$cImprint: Springer,$d2017.
215   $a1 online resource (58 p.)
225 1 $aSpringerBriefs in Computational Electromagnetics,$x2365-6239
300   $aIncludes index.
311   $a981-10-2268-2 
327   $aIntroduction -- Role of Plasma Parameters -- Formulation for EM Propagation in Plasma covered RAM -- Results and Discussion -- Conclusion -- References -- Subject Index.
330   $aThis book focuses on EM propagation characteristics within multilayered plasma-dielectric-metallic media. The method used for analysis is impedance transformation method. Plasma covered radar absorbing material is approximated as a multi-layered dielectric medium. The plasma is considered to be bounded homogeneous/inhomogeneous medium. The reflection coefficient and hence return loss is analytically derived. The role of plasma parameters, such as electron density, collision frequency, plasma thickness, and plasma density profile in the absorption behavior of multi-layered plasma-RAM structure is described. This book provides a clearer picture of EM propagation within plasma. The reader will get an insight of plasma parameters that play significant role in deciding the absorption characteristics of plasma covered surfaces.
410  0$aSpringerBriefs in Computational Electromagnetics,$x2365-6239
606   $aMicrowaves
606   $aOptical engineering
606   $aOptics
606   $aElectrodynamics
606   $aElectronics
606   $aMicroelectronics
606   $aMicrowaves, RF and Optical Engineering$3https://scigraph.springernature.com/ontologies/product-market-codes/T24019
606   $aClassical Electrodynamics$3https://scigraph.springernature.com/ontologies/product-market-codes/P21070
606   $aElectronics and Microelectronics, Instrumentation$3https://scigraph.springernature.com/ontologies/product-market-codes/T24027
615  0$aMicrowaves.
615  0$aOptical engineering.
615  0$aOptics.
615  0$aElectrodynamics.
615  0$aElectronics.
615  0$aMicroelectronics.
615 14$aMicrowaves, RF and Optical Engineering.
615 24$aClassical Electrodynamics.
615 24$aElectronics and Microelectronics, Instrumentation.
676   $a620
700   $aSingh$b Hema$4aut$4http://id.loc.gov/vocabulary/relators/aut$0721045
702   $aAntony$b Simy$4aut$4http://id.loc.gov/vocabulary/relators/aut
702   $aRawat$b Harish Singh$4aut$4http://id.loc.gov/vocabulary/relators/aut
906   $aBOOK
912   $a9910254345303321
996   $aEM Wave Propagation Analysis in Plasma Covered Radar Absorbing Material$92100659
997   $aUNINA