LEADER 00882nam0-2200325---450 001 990008258720403321 005 20231025140031.0 010 $a0-521-01175-2 035 $a000825872 035 $aFED01000825872 035 $a(Aleph)000825872FED01 100 $a20060118d2004----km-y0itay50------ba 101 0 $aeng 102 $aGB 105 $a----a---001yy 200 1 $aLanguage policy$fBernard Spolsky 210 $aCambridge$cCambridge University press$d2004 215 $aXI, 250 p.$d22 cm 225 1 $aKey topics in sociolinguistics 610 0 $aLinguaggio politico 610 0 $aSociolinguistica 676 $a306.44 700 1$aSpolsky,$bBernard$0290555 801 0$aIT$bUNINA$c20060118$gRICA$2UNIMARC 901 $aBK 912 $a990008258720403321 952 $a404.4 SPOL 2$fFLFBC 959 $aFLFBC 996 $aLanguage policy$9741994 997 $aUNINA LEADER 04499nam 22006735 450 001 9910254320203321 005 20200702153345.0 010 $a3-662-54209-9 024 7 $a10.1007/978-3-662-54209-5 035 $a(CKB)3710000001388408 035 $a(DE-He213)978-3-662-54209-5 035 $a(MiAaPQ)EBC4863261 035 $a(PPN)20146845X 035 $a(EXLCZ)993710000001388408 100 $a20170519d2017 u| 0 101 0 $aeng 135 $aurnn|008mamaa 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aReliability Engineering $eTheory and Practice /$fby Alessandro Birolini 205 $a8th ed. 2017. 210 1$aBerlin, Heidelberg :$cSpringer Berlin Heidelberg :$cImprint: Springer,$d2017. 215 $a1 online resource (650 p.) 300 $a"With 210 Figures, 60 Tables, 140 Examples, and 80 Problems for Homework." 311 $a3-662-54208-0 320 $aIncludes bibliographical references and index. 327 $aBasic Concepts, Quality & Reliability (RAMS) Assurance of Complex Equip. & Systems -- Reliability Analysis During the Design Phase -- Qualification Tests for Components and Assemblies -- Maintainability Analysis -- Design Guidelines for Reliability, Maintainability, and Software Quality -- Reliability and Availability of Repairable Systems -- Statistical Quality Control and Reliability Tests -- Quality & Reliability (RAMS) Assurance During Production Phase. 330 $aThis book shows how to build in and assess reliability, availability, maintainability, and safety (RAMS) of components, equipment, and systems. It presents the state-of-the-art of reliability (RAMS) engineering, in theory & practice, and is based on over 30 years author's experience in this field, half in industry and half as Professor of Reliability Engineering at the ETH, Zurich. The book structure allows rapid access to practical results. Methods & tools are given in a way that they can be tailored to cover different RAMS requirement levels. Thanks to Appendices A6 - A8 the book is mathematically self-contained, and can be used as a text book or as a desktop reference with a large number of tables (60), figures (210), and examples / exercises (220, of which 80 as problems for homework). The request for a Chinese translation of this book and the very high eBook requirements ( > 10,000 per year since 2013) were the motivation for this final edition, the 13th since 1985, including German editions. Extended and carefully reviewed to improve accuracy, it represents the continuous improvement effort to satisfy reader's needs and confidence. New are an introduction to risk management with structurally new models based on semi- Markov processes & to the concept of mean time to accident, reliability & availability of a k-out-of-n redundancy with arbitrary repair rate for n - k=2, 10 new homework problems, and refinements, in particular, on multiple failure mechanisms, approximate expressions for large complex systems, data analysis, comments on ?, MTBF, MTTF, MTTR, R, PA. 606 $aQuality control 606 $aReliability 606 $aIndustrial safety 606 $aOrganization 606 $aPlanning 606 $aEconomic policy 606 $aElectronics 606 $aMicroelectronics 606 $aQuality Control, Reliability, Safety and Risk$3https://scigraph.springernature.com/ontologies/product-market-codes/T22032 606 $aOrganization$3https://scigraph.springernature.com/ontologies/product-market-codes/516000 606 $aR & D/Technology Policy$3https://scigraph.springernature.com/ontologies/product-market-codes/W43000 606 $aElectronics and Microelectronics, Instrumentation$3https://scigraph.springernature.com/ontologies/product-market-codes/T24027 615 0$aQuality control. 615 0$aReliability. 615 0$aIndustrial safety. 615 0$aOrganization. 615 0$aPlanning. 615 0$aEconomic policy. 615 0$aElectronics. 615 0$aMicroelectronics. 615 14$aQuality Control, Reliability, Safety and Risk. 615 24$aOrganization. 615 24$aR & D/Technology Policy. 615 24$aElectronics and Microelectronics, Instrumentation. 676 $a658.56 700 $aBirolini$b Alessandro$4aut$4http://id.loc.gov/vocabulary/relators/aut$0746809 906 $aBOOK 912 $a9910254320203321 996 $aReliability engineering$91507018 997 $aUNINA