LEADER 01595nam a2200385 i 4500 001 991000689349707536 005 20020507172307.0 008 951027s1982 ne ||| | eng 020 $a0444863583 035 $ab10743479-39ule_inst 035 $aLE01300751$9ExL 040 $aDip.to Matematica$beng 082 0 $a629.8312 084 $aAMS 49-XX 084 $aQA402.3B4313 100 1 $aBensoussan, Alain$014378 245 10$aApplications of variational inequalities in stochastic control /$cAlain Bensoussan, Jacques-Louis Lions 250 $aEnglish version /$bedited, prepared, and produced by Trans-Inter-Scientia 260 $aAmsterdam :$bNorth-Holland,$c1982 300 $axi, 564 p. ;$c23 cm. 490 0 $aStudies in mathematics and its applications,$x0168-2024 ;$v12 500 $aBibliography: p. 559-564. 500 $aTransl. of: Applications des inéquations variationnelles en controle stochastique. - Paris : Bordas, c1978 650 4$aCalculus of variations 650 4$aControl theory 650 4$aInequalities 650 4$aPartial differential equations 650 4$aStochastic processes 700 1 $aLions, Jacques Louis$eauthor$4http://id.loc.gov/vocabulary/relators/aut$020991 907 $a.b10743479$b23-02-17$c28-06-02 912 $a991000689349707536 945 $aLE013 49-XX BEN11 (1982)$g1$i2013000038650$lle013$o-$pE0.00$q-$rl$s- $t0$u1$v41$w1$x0$y.i10834953$z28-06-02 996 $aApplications of variational inequalities in stochastic control$91745090 997 $aUNISALENTO 998 $ale013$b01-01-95$cm$da $e-$feng$gne $h0$i1 LEADER 03412nam 22006735 450 001 9910254230103321 005 20200705215001.0 010 $a981-10-0884-1 024 7 $a10.1007/978-981-10-0884-9 035 $a(CKB)3710000000645851 035 $a(EBL)4505129 035 $a(SSID)ssj0001665835 035 $a(PQKBManifestationID)16454977 035 $a(PQKBTitleCode)TC0001665835 035 $a(PQKBWorkID)15000898 035 $a(PQKB)10427067 035 $a(DE-He213)978-981-10-0884-9 035 $a(MiAaPQ)EBC4505129 035 $z(PPN)258861703 035 $a(PPN)193445166 035 $a(EXLCZ)993710000000645851 100 $a20160413d2016 u| 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aCMOS RF Circuit Design for Reliability and Variability /$fby Jiann-Shiun Yuan 205 $a1st ed. 2016. 210 1$aSingapore :$cSpringer Singapore :$cImprint: Springer,$d2016. 215 $a1 online resource (108 p.) 225 1 $aSpringerBriefs in Reliability,$x2196-1123 300 $aDescription based upon print version of record. 311 $a981-10-0882-5 320 $aIncludes bibliographical references at the end of each chapters. 327 $aCMOS Transistor Reliability and Variability -- Wireless Receiver and Transmitter Circuit Reliability -- Low Noise Amplifier Reliability and Variability -- Power Amplifier Reliability and Variability -- Voltage Controlled Oscillator Reliability and Variability -- Mixer Reliability. 330 $aThe subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations. 410 0$aSpringerBriefs in Reliability,$x2196-1123 606 $aElectronic circuits 606 $aMicrowaves 606 $aOptical engineering 606 $aCircuits and Systems$3https://scigraph.springernature.com/ontologies/product-market-codes/T24068 606 $aElectronic Circuits and Devices$3https://scigraph.springernature.com/ontologies/product-market-codes/P31010 606 $aMicrowaves, RF and Optical Engineering$3https://scigraph.springernature.com/ontologies/product-market-codes/T24019 615 0$aElectronic circuits. 615 0$aMicrowaves. 615 0$aOptical engineering. 615 14$aCircuits and Systems. 615 24$aElectronic Circuits and Devices. 615 24$aMicrowaves, RF and Optical Engineering. 676 $a621.38412 700 $aYuan$b Jiann-Shiun$4aut$4http://id.loc.gov/vocabulary/relators/aut$0761236 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910254230103321 996 $aCMOS RF Circuit Design for Reliability and Variability$91541117 997 $aUNINA