LEADER 03412nam 22006735 450 001 9910254230103321 005 20200705215001.0 010 $a981-10-0884-1 024 7 $a10.1007/978-981-10-0884-9 035 $a(CKB)3710000000645851 035 $a(EBL)4505129 035 $a(SSID)ssj0001665835 035 $a(PQKBManifestationID)16454977 035 $a(PQKBTitleCode)TC0001665835 035 $a(PQKBWorkID)15000898 035 $a(PQKB)10427067 035 $a(DE-He213)978-981-10-0884-9 035 $a(MiAaPQ)EBC4505129 035 $z(PPN)258861703 035 $a(PPN)193445166 035 $a(EXLCZ)993710000000645851 100 $a20160413d2016 u| 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aCMOS RF Circuit Design for Reliability and Variability /$fby Jiann-Shiun Yuan 205 $a1st ed. 2016. 210 1$aSingapore :$cSpringer Singapore :$cImprint: Springer,$d2016. 215 $a1 online resource (108 p.) 225 1 $aSpringerBriefs in Reliability,$x2196-1123 300 $aDescription based upon print version of record. 311 $a981-10-0882-5 320 $aIncludes bibliographical references at the end of each chapters. 327 $aCMOS Transistor Reliability and Variability -- Wireless Receiver and Transmitter Circuit Reliability -- Low Noise Amplifier Reliability and Variability -- Power Amplifier Reliability and Variability -- Voltage Controlled Oscillator Reliability and Variability -- Mixer Reliability. 330 $aThe subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations. 410 0$aSpringerBriefs in Reliability,$x2196-1123 606 $aElectronic circuits 606 $aMicrowaves 606 $aOptical engineering 606 $aCircuits and Systems$3https://scigraph.springernature.com/ontologies/product-market-codes/T24068 606 $aElectronic Circuits and Devices$3https://scigraph.springernature.com/ontologies/product-market-codes/P31010 606 $aMicrowaves, RF and Optical Engineering$3https://scigraph.springernature.com/ontologies/product-market-codes/T24019 615 0$aElectronic circuits. 615 0$aMicrowaves. 615 0$aOptical engineering. 615 14$aCircuits and Systems. 615 24$aElectronic Circuits and Devices. 615 24$aMicrowaves, RF and Optical Engineering. 676 $a621.38412 700 $aYuan$b Jiann-Shiun$4aut$4http://id.loc.gov/vocabulary/relators/aut$0761236 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910254230103321 996 $aCMOS RF Circuit Design for Reliability and Variability$91541117 997 $aUNINA