LEADER 03512nam 22006375 450 001 9910254227003321 005 20200706104957.0 010 $a3-319-20385-1 024 7 $a10.1007/978-3-319-20385-0 035 $a(CKB)3710000000498860 035 $a(EBL)4068069 035 $a(SSID)ssj0001584591 035 $a(PQKBManifestationID)16265383 035 $a(PQKBTitleCode)TC0001584591 035 $a(PQKBWorkID)14864790 035 $a(PQKB)11368704 035 $a(DE-He213)978-3-319-20385-0 035 $a(MiAaPQ)EBC4068069 035 $a(PPN)190517913 035 $a(EXLCZ)993710000000498860 100 $a20151028d2016 u| 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aDesign for Manufacturability with Advanced Lithography /$fby Bei Yu, David Z. Pan 205 $a1st ed. 2016. 210 1$aCham :$cSpringer International Publishing :$cImprint: Springer,$d2016. 215 $a1 online resource (173 p.) 300 $aDescription based upon print version of record. 311 $a3-319-20384-3 320 $aIncludes bibliographical references at the end of each chapters and index. 327 $aIntroduction -- Layout Decomposition for Triple Patterning -- Layout Decomposition for Other Patterning Techniques -- Standard Cell Compliance and Placement Co-Optimization -- Design for Manufacturability with E-Beam Lithography -- Conclusions and Future Works.-. 330 $aThis book introduces readers to the most advanced research results on Design for Manufacturability (DFM) with multiple patterning lithography (MPL) and electron beam lithography (EBL).  The authors describe in detail a set of algorithms/methodologies to resolve issues in modern design for manufacturability problems with advanced lithography.  Unlike books that discuss DFM from the product level, or physical manufacturing level, this book describes DFM solutions from a circuit design level, such that most of the critical problems can be formulated and solved through combinatorial algorithms. Enables readers to tackle the challenge of layout decompositions for different patterning techniques; Presents a coherent framework, including standard cell compliance and detailed placement, to enable Triple Patterning Lithography (TPL) friendly design; Includes coverage of the design for manufacturability with E-Beam lithography. 606 $aElectronic circuits 606 $aMicroprocessors 606 $aElectronics 606 $aMicroelectronics 606 $aCircuits and Systems$3https://scigraph.springernature.com/ontologies/product-market-codes/T24068 606 $aProcessor Architectures$3https://scigraph.springernature.com/ontologies/product-market-codes/I13014 606 $aElectronics and Microelectronics, Instrumentation$3https://scigraph.springernature.com/ontologies/product-market-codes/T24027 615 0$aElectronic circuits. 615 0$aMicroprocessors. 615 0$aElectronics. 615 0$aMicroelectronics. 615 14$aCircuits and Systems. 615 24$aProcessor Architectures. 615 24$aElectronics and Microelectronics, Instrumentation. 676 $a620 700 $aYu$b Bei$4aut$4http://id.loc.gov/vocabulary/relators/aut$0788068 702 $aPan$b David Z$4aut$4http://id.loc.gov/vocabulary/relators/aut 906 $aBOOK 912 $a9910254227003321 996 $aDesign for Manufacturability with Advanced Lithography$92534937 997 $aUNINA