LEADER 03800nam 22006975 450 001 9910254050203321 005 20200630231051.0 010 $a981-10-0797-7 024 7 $a10.1007/978-981-10-0797-2 035 $a(CKB)3710000000829773 035 $a(DE-He213)978-981-10-0797-2 035 $a(MiAaPQ)EBC4635871 035 $a(PPN)194805263 035 $a(EXLCZ)993710000000829773 100 $a20160810d2016 u| 0 101 0 $aeng 135 $aurnn|008mamaa 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aRefractive Indices of Solids /$fby Stepan S. Batsanov, Evgeny D. Ruchkin, Inga A. Poroshina 205 $a1st ed. 2016. 210 1$aSingapore :$cSpringer Singapore :$cImprint: Springer,$d2016. 215 $a1 online resource (IX, 108 p.) 225 1 $aSpringerBriefs in Applied Sciences and Technology,$x2191-530X 311 $a981-10-0796-9 320 $aIncludes bibliographical references at the end of each chapters. 327 $aAnisotropy, dispersion, theory, effect of structure -- Anisotropy, dispersion, theory, effect of structure -- Chemical bonding and refractive indices -- Refractive indices of elements and binary compounds -- Refractive indices of ternary or complex halides and oxides -- Refractive indices of silicates and germinates -- Refractive indices of uranium compounds -- Refractive indices of the oxygen-containing salts -- Refractive indices in the coordination compounds of b-elements -- Refractive indices in coordination compounds of a-metals -- Crystallohydrates of simple and complex compounds -- Refractive indices of selected organic compounds. 330 $aThis book highlights the basics of crystal optics methods and refractive index (RI) measurement techniques in various solids, as well as their scientific and technological applications. In addition to new techniques for cases when traditional techniques are impractical, such as for highly refracting powders, anomalous dispersion of light in the studied solid, or for colloids, it also describes conventional methods of RI measurement. 410 0$aSpringerBriefs in Applied Sciences and Technology,$x2191-530X 606 $aMaterials science 606 $aSpectrum analysis 606 $aMineralogy 606 $aMicroscopy 606 $aEngineering?Materials 606 $aCharacterization and Evaluation of Materials$3https://scigraph.springernature.com/ontologies/product-market-codes/Z17000 606 $aSpectroscopy/Spectrometry$3https://scigraph.springernature.com/ontologies/product-market-codes/C11020 606 $aMineralogy$3https://scigraph.springernature.com/ontologies/product-market-codes/G38000 606 $aSpectroscopy and Microscopy$3https://scigraph.springernature.com/ontologies/product-market-codes/P31090 606 $aMaterials Engineering$3https://scigraph.springernature.com/ontologies/product-market-codes/T28000 615 0$aMaterials science. 615 0$aSpectrum analysis. 615 0$aMineralogy. 615 0$aMicroscopy. 615 0$aEngineering?Materials. 615 14$aCharacterization and Evaluation of Materials. 615 24$aSpectroscopy/Spectrometry. 615 24$aMineralogy. 615 24$aSpectroscopy and Microscopy. 615 24$aMaterials Engineering. 676 $a535.324 700 $aBatsanov$b Stepan S$4aut$4http://id.loc.gov/vocabulary/relators/aut$0768309 702 $aRuchkin$b Evgeny D$4aut$4http://id.loc.gov/vocabulary/relators/aut 702 $aPoroshina$b Inga A$4aut$4http://id.loc.gov/vocabulary/relators/aut 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910254050203321 996 $aRefractive Indices of Solids$92526795 997 $aUNINA