LEADER 01249nam--2200457---450 001 990000873230203316 005 20180308150856.0 010 $a2-221-05464-4 035 $a0087323 035 $aUSA010087323 035 $a(ALEPH)000087323USA01 035 $a0087323 100 $a20020115d1990----km-y0itay0103----ba 101 $afre 102 $aFR 105 $a||||||||001yy 200 1 $a<> ésotérisme$fPierre A. Riffard 210 $aParis$cR. 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In the first part of the book the reader will find a theoretical introduction about atomic force microscopy, focused on force-distance curves, and mechanical properties of polymers. The discussion of several practical issues concerning the acquisition and the interpretation of force-distance curves will help scientists starting to employ this technique. The second part of the book deals with the practical measurement of mechanical properties of polymers by means of AFM force-distance curves. Several "hands-on" examples are illustrated in a very detailed manner, with particular attention to the sample preparation, data analysis, and typical artefacts. This section gives a complete overview about the qualitative characterization and quantitative determination of the mechanical properties of homogeneous polymer samples, polymer brushes, polymer thin films, confined polymer samples, model blends and microstructured polymer blends through AFM force-distance curves. The book also introduces to new approaches and measurement techniques, like creep compliance and force modulation measurements, pointing out approximations, limitations and issues requiring further confirmation. 410 0$aSpringer Laboratory, Manuals in Polymer Science,$x0945-6074 606 $aPolymers 606 $aNanoscience 606 $aNanoscience 606 $aNanostructures 606 $aNanotechnology 606 $aMaterials?Surfaces 606 $aThin films 606 $aChemistry, Physical and theoretical 606 $aSpectrum analysis 606 $aMicroscopy 606 $aPolymer Sciences$3https://scigraph.springernature.com/ontologies/product-market-codes/C22008 606 $aNanoscale Science and Technology$3https://scigraph.springernature.com/ontologies/product-market-codes/P25140 606 $aNanotechnology$3https://scigraph.springernature.com/ontologies/product-market-codes/Z14000 606 $aSurfaces and Interfaces, Thin Films$3https://scigraph.springernature.com/ontologies/product-market-codes/Z19000 606 $aPhysical Chemistry$3https://scigraph.springernature.com/ontologies/product-market-codes/C21001 606 $aSpectroscopy and Microscopy$3https://scigraph.springernature.com/ontologies/product-market-codes/P31090 615 0$aPolymers. 615 0$aNanoscience. 615 0$aNanoscience. 615 0$aNanostructures. 615 0$aNanotechnology. 615 0$aMaterials?Surfaces. 615 0$aThin films. 615 0$aChemistry, Physical and theoretical. 615 0$aSpectrum analysis. 615 0$aMicroscopy. 615 14$aPolymer Sciences. 615 24$aNanoscale Science and Technology. 615 24$aNanotechnology. 615 24$aSurfaces and Interfaces, Thin Films. 615 24$aPhysical Chemistry. 615 24$aSpectroscopy and Microscopy. 676 $a620.19204292 700 $aCappella$b Brunero$4aut$4http://id.loc.gov/vocabulary/relators/aut$01060819 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910254038803321 996 $aMechanical Properties of Polymers Measured through AFM Force-Distance Curves$92515860 997 $aUNINA