LEADER 04049nam 22007815 450 001 9910299853003321 005 20200630035521.0 010 $a1-4939-1349-2 024 7 $a10.1007/978-1-4939-1349-7 035 $a(CKB)3710000000311456 035 $a(EBL)1965012 035 $a(OCoLC)897810230 035 $a(SSID)ssj0001408104 035 $a(PQKBManifestationID)11746684 035 $a(PQKBTitleCode)TC0001408104 035 $a(PQKBWorkID)11341445 035 $a(PQKB)10984458 035 $a(DE-He213)978-1-4939-1349-7 035 $a(MiAaPQ)EBC1965012 035 $a(PPN)183147960 035 $a(EXLCZ)993710000000311456 100 $a20141203d2015 u| 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aCMOS Test and Evaluation $eA Physical Perspective /$fby Manjul Bhushan, Mark B. Ketchen 205 $a1st ed. 2015. 210 1$aNew York, NY :$cSpringer New York :$cImprint: Springer,$d2015. 215 $a1 online resource (431 p.) 300 $aDescription based upon print version of record. 311 $a1-4939-1348-4 320 $aIncludes bibliographical references and index. 327 $aIntroduction -- CMOS Circuit Basics -- CMOS Storage Elements and Synchronous Logic -- IDDQ and Power -- Embedded PVT Monitors -- Variability -- Product Chip Test and Characterization -- Reliability, Burn-In and Guardbands -- Data Analysis and Characterization -- CMOS Metrics and Model Evaluation. 330 $aThis book extends test structure applications described in Microelectronic Test Struc­tures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and product test data from a basic knowledge of the physical behavior of the constituent components. Elementary circuits that exhibit key properties of complex CMOS chips are simulated and analyzed, and an integrated view of design, test and characterization is developed. Appropriately designed circuit monitors embedded in the CMOS chip serve to correlate CMOS technology models and circuit design tools to the hardware and also aid in test debug. Impact of silicon process variability, reliability, and power and performance sensitivities to a range of product application conditions are described. Circuit simulations exemplify the methodologies presented, and problems are included at the end of the chapters. 606 $aElectronics 606 $aMicroelectronics 606 $aElectronic circuits 606 $aSemiconductors 606 $aQuality control 606 $aReliability 606 $aIndustrial safety 606 $aElectronics and Microelectronics, Instrumentation$3https://scigraph.springernature.com/ontologies/product-market-codes/T24027 606 $aCircuits and Systems$3https://scigraph.springernature.com/ontologies/product-market-codes/T24068 606 $aSemiconductors$3https://scigraph.springernature.com/ontologies/product-market-codes/P25150 606 $aQuality Control, Reliability, Safety and Risk$3https://scigraph.springernature.com/ontologies/product-market-codes/T22032 615 0$aElectronics. 615 0$aMicroelectronics. 615 0$aElectronic circuits. 615 0$aSemiconductors. 615 0$aQuality control. 615 0$aReliability. 615 0$aIndustrial safety. 615 14$aElectronics and Microelectronics, Instrumentation. 615 24$aCircuits and Systems. 615 24$aSemiconductors. 615 24$aQuality Control, Reliability, Safety and Risk. 676 $a537.622 676 $a620 676 $a621.381 676 $a621.3815 700 $aBhushan$b Manjul$4aut$4http://id.loc.gov/vocabulary/relators/aut$0720769 702 $aKetchen$b Mark B$4aut$4http://id.loc.gov/vocabulary/relators/aut 906 $aBOOK 912 $a9910299853003321 996 $aCMOS Test and Evaluation$92505958 997 $aUNINA LEADER 02014nam 22005413a 450 001 9910220030703321 005 20250204000041.0 010 $a9783643655325 010 $a3643655320 024 7 $a10.26530/oapen_628295 035 $a(CKB)3800000000216470 035 $a(OAPEN)628295 035 $a(oapen)https://directory.doabooks.org/handle/20.500.12854/39500 035 $a(ScCtBLL)20272ce4-1d2a-407e-867a-935b937b91bb 035 $a(OCoLC)1048177807 035 $a(oapen)doab39500 035 $a(EXLCZ)993800000000216470 100 $a20250204i20172020 uu 101 0 $ager 135 $auuuuu---auuuu 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 00$aWende und Übergang$fAlexandar Alexandrov 210 $cLIT Verlag GmbH & Co. KG$d2017 210 1$a[s.l.] :$cLIT Verlag GmbH & Co. KG,$d2017. 215 $a1 online resource (272 Seiten) 311 08$a9783643505323 311 08$a3643505329 330 $aBulgaria's cultural policy has experienced many transformations since the revolution. One of the most important is that at the beginning the conviction developed that those elements which could not support themselves because of the new market situation made no relevant social contribution. One of the aims of this thesis is to question what the reality of "cultural economy" is and how this is reflected in law-making and life. 606 $aPolitics & government$2bicssc 610 $acultural politics 610 $aEast European Studies 610 $acontemporary history Bulgaria 610 $acultural economy 610 $aKulturpolitik 610 $aOsteuropastudien 610 $aZeitgeschichte Bulgariens 610 $aKulturwirtschaft Bulgarien 610 $aSofia 615 7$aPolitics & government 700 $aAlexandrov$b Alexandar$0926404 801 0$bScCtBLL 801 1$bScCtBLL 906 $aBOOK 912 $a9910220030703321 996 $aWende und Übergang$94321317 997 $aUNINA