LEADER 01430oam 2200457zu 450 001 9910164748803321 005 20210807002214.0 010 $a0-8031-6941-8 035 $a(CKB)3170000000044805 035 $a(SSID)ssj0001489796 035 $a(PQKBManifestationID)11920422 035 $a(PQKBTitleCode)TC0001489796 035 $a(PQKBWorkID)11459369 035 $a(PQKB)10045626 035 $a(NjHacI)993170000000044805 035 $a(EXLCZ)993170000000044805 100 $a20160829d1969 uy 101 0 $aeng 135 $aur||||||||||| 181 $ctxt 182 $cc 183 $acr 200 10$aElectron Microfractography 210 31$a[Place of publication not identified]$cAmerican Society for Testing & Materials$d1969 215 $a1 online resource (v, 235 pages) $cillustrations 225 1 $aASTM special technical publication, ;$v453 300 $aBibliographic Level Mode of Issuance: Monograph 311 $a0-8031-6646-X 320 $aIncludes bibliographical references. 410 0$aASTM special technical publication ;$v453. 606 $aElectron microscopy$vCongresses 606 $aFractography$vCongresses 615 0$aElectron microscopy 615 0$aFractography 676 $a620.166 700 $aBrothers$b A$0979373 801 0$bPQKB 906 $aBOOK 912 $a9910164748803321 996 $aElectron Microfractography$92232613 997 $aUNINA