LEADER 01427oam  2200433zu 450 
001 9910164725503321
005 20210807002230.0
010   $a0-8031-4600-0
035   $a(CKB)3170000000044847
035   $a(SSID)ssj0001489611
035   $a(PQKBManifestationID)11848648
035   $a(PQKBTitleCode)TC0001489611
035   $a(PQKBWorkID)11458847
035   $a(PQKB)10556111
035   $a(NjHacI)993170000000044847
035   $a(EXLCZ)993170000000044847
100   $a20160829d1971      uy              
101 0 $aeng
135   $aur|||||||||||
181   $ctxt
182   $cc
183   $acr
200 10$aApplications of Electron Microfractography to Materials Research
210 31$a[Place of publication not identified]$cAmerican Society for Testing & Materials$d1971
215   $a1 online resource (96 pages) $cillustrations
225 1 $aASTM special technical publication ;$v493
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-8031-0746-3 
320   $aIncludes bibliographical references and index.
410  0$aASTM special technical publication ;$v493.
606   $aElectron microscopy
615  0$aElectron microscopy.
676   $a502.825
700   $aWiebe$b W$0946498
801  0$bPQKB
906   $aBOOK
912   $a9910164725503321
996   $aApplications of Electron Microfractography to Materials Research$92138356
997   $aUNINA