LEADER 01678oam  2200505zu 450 
001 9910164289503321
005 20210807002203.0
010   $a0-8031-5389-9
035   $a(CKB)3170000000044295
035   $a(SSID)ssj0001184356
035   $a(PQKBManifestationID)11685061
035   $a(PQKBTitleCode)TC0001184356
035   $a(PQKBWorkID)11191780
035   $a(PQKB)10987769
035   $a(EXLCZ)993170000000044295
100   $a20160829d1998      uy              
101 0 $aeng
181   $ctxt
182   $cc
183   $acr
200 00$aRecombination lifetime measurements in silicon
210 31$a[Place of publication not identified]$cASTM$d1998
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-8031-2489-9 
606   $aSemiconductors$xTesting$xCongresses
606   $aService life (Engineering)$xCongresses$xForecasting
606   $aElectronic measurements$xCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aSemiconductors$xTesting$xCongresses
615  0$aService life (Engineering)$xCongresses$xForecasting
615  0$aElectronic measurements$xCongresses
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
676   $a621.3815/2
702   $aHughes$b William M.$f1948-
702   $aBacher$b Fred R
702   $aGupta$b D. C
801  0$bPQKB
906   $aBOOK
912   $a9910164289503321
996   $aRecombination lifetime measurements in silicon$91988075
997   $aUNINA