LEADER 01366oam 2200433zu 450 001 9910164270403321 005 20210807002219.0 010 $a0-8031-6799-7 035 $a(CKB)3170000000044740 035 $a(SSID)ssj0001489585 035 $a(PQKBManifestationID)11848644 035 $a(PQKBTitleCode)TC0001489585 035 $a(PQKBWorkID)11454100 035 $a(PQKB)11715317 035 $a(NjHacI)993170000000044740 035 $a(EXLCZ)993170000000044740 100 $a20160829d1966 uy 101 0 $aeng 135 $aur||||||||||| 181 $ctxt 182 $cc 183 $acr 200 10$aAdvances in Electron Metallography 210 31$a[Place of publication not identified]$cAmerican Society for Testing & Materials$d1966 215 $a1 online resource (131 pages) $cillustrations 225 1 $aJournal of ASTM International ;$vNumber 396 300 $aBibliographic Level Mode of Issuance: Monograph 311 $a0-8031-6623-0 410 0$aASTM special technical publication ;$vNumber 396. 517 $aAdvances in Electron Metallography 606 $aMetallography$vCongresses 615 0$aMetallography 676 $a669.95 700 $aBanerjee$b B$0345686 801 0$bPQKB 906 $aBOOK 912 $a9910164270403321 996 $aAdvances in Electron Metallography$91968143 997 $aUNINA