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100   $a20160829d1968      uy 
101 0 $aeng
135   $aur|||||||||||
181   $ctxt
182   $cc
183   $acr
200 10$aElectron Fractography
210 31$a[Place of publication not identified]$cAmerican Society for Testing & Materials$d1968
215   $a1 online resource (230 pages) $cillustrations
225 1 $aASTM special technical publication, ;$v436
300   $aBibliographic Level Mode of Issuance: Monograph
311 08$a0-8031-4497-0 
320   $aIncludes bibliographical references.
410  0$aASTM special technical publication ;$v436.
606   $aFractography
606   $aElectron microscopes
615  0$aFractography.
615  0$aElectron microscopes.
676   $a669.950282
700   $aBeachem$b C. D$g(Cedric D.),$0922748
801  0$bPQKB
906   $aBOOK
912   $a9910164266203321
996   $aElectron Fractography$92206669
997   $aUNINA