LEADER 01404ojm 2200229z- 450 001 9910150646103321 005 20230913112557.0 010 $a1-4423-1927-5 035 $a(CKB)3710000000944594 035 $a(BIP)036633407 035 $a(EXLCZ)993710000000944594 100 $a20231107c2010uuuu -u- - 101 0 $aeng 200 10$aPimsleur Farsi Persian Level 1 Lessons 11-15 MP3 : Learn to Speak and Understand Farsi Persian with Pimsleur Language Programs 210 $cPimsleur (Simon & Schuster) 330 8 $aPimsleur® equals success. Just one 30minute lesson a day gets you speaking and understanding like no other program. Farsi Persian Phase 1, Units 1115 build on material taught in prior units. Each lesson provides 30 minutes of spoken language practice, with an introductory conversation, and new vocabulary and structures. Detailed instructions enable you to understand and participate in the conversation. Each lesson contains practice for vocabulary introduced in previous lessons. The emphasis is on pronunciation and comprehension, and on learning to speak Farsi Persian. 517 $aPimsleur Farsi Persian Level 1 Lessons 11-15 MP3 700 $aPimsleur$01434898 906 $aAUDIO 912 $a9910150646103321 996 $aPimsleur Farsi Persian Level 1 Lessons 11-15 MP3 : Learn to Speak and Understand Farsi Persian with Pimsleur Language Programs$93592803 997 $aUNINA LEADER 05609nam 2200661Ia 450 001 9910830318003321 005 20230617040632.0 010 $a1-280-85401-4 010 $a9786610854011 010 $a3-527-60666-1 010 $a3-527-60687-4 035 $a(CKB)1000000000376964 035 $a(EBL)481681 035 $a(OCoLC)70114976 035 $a(SSID)ssj0000207934 035 $a(PQKBManifestationID)11199015 035 $a(PQKBTitleCode)TC0000207934 035 $a(PQKBWorkID)10238819 035 $a(PQKB)10357020 035 $a(MiAaPQ)EBC481681 035 $a(EXLCZ)991000000000376964 100 $a20060908d2005 fy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 00$aNanoscale calibration standards and methods$b[electronic resource] $edimensional and related measurements in the micro- and nanometer range /$fedited by Gu?nter Wilkening, Ludger Koenders 210 $aWeinheim ;$a[Chichester?] $cWiley-VCH$dc2005 215 $a1 online resource (543 p.) 300 $aConference proceedings. 311 $a3-527-40502-X 320 $aIncludes bibliographical references and index. 327 $aNanoscale Calibration Standards and Methods; Contents; List of Contributors; Part I Instrumentation - Overview; 1 Metrological Scanning Probe Microscopes - Instruments for Dimensional Nanometrology; 1.1 Introduction; 1.2 High-Resolution Probing Systems; 1.2.1 Sensor Objective with Beam Deflection Detection; 1.2.2 Sensor Objective with Piezolever Module; 1.2.3 Sensor Objective with Tuning Fork Module; 1.2.4 Sensor Head for Combined Scanning Probe and Interference Microscopy; 1.3 Metrology Systems Based on Scanning Probe Microscopes; 1.3.1 Scanning Force Microscopes of Type Veritekt 327 $a1.3.2 Metrological Large Range Scanning Force Microscope1.4 Summary; Acknowledgments; References; 2 Nanometrology at the IMGC; 2.1 Introduction; 2.2 Surface Metrology; 2.2.1 Scanning Probe Microscopy; 2.2.2 Optical Diffractometry; 2.2.3 Stylus Profilometry; 2.3 Atomic Scale Metrology; 2.3.1 Lattice Parameter of Silicon; 2.3.2 Combined Optical and X-Ray Interferometry (COXI); 2.4 Phase-Contrast Topograpy; 2.4.1 Detection of Small Lattice Strain; 2.4.2 Phase-Contrast Imaging; 2.5 Nanobalance; 2.6 Conclusions; References; 3 Metrological Applications of X-ray Interferometry; 3.1 Introduction 327 $a3.2 Measurement of Non-linearity in Optical Interferometers3.3 Combined Optical and X-ray Interferometry; 3.4 Measurement of Small Angles; 3.5 X-ray Interferometry and Scanning Probe Microscopy; 3.6 Conclusions; References; Part II Instrumentation - Long-range Scanning Probe Microscopes; 4 Advances in Traceable Nanometrology with the Nanopositioning and Nanomeasuring Machine; 4.1 Introduction; 4.2 Design and Operation; 4.3 Uncertainty Budget; 4.4 Focus Sensor; 4.5 Measuring Opportunities and Performance with Focus Sensor; 4.6 Focus Probe with SFM Cantilever; 4.7 Conclusion; Acknowledgements 327 $aReferences5 Coordinate Measurements in Microsystems by Using AFM-Probing: Problems and Solutions; 5.1 Introduction; 5.2 Realizing CMMs for Microsystems; 5.3 Problems and Solutions; 5.3.1 Dynamics of Positioning System; 5.3.2 CMM: One-Millimeter Scan; 5.3.3 Measuring Strategies; 5.4 Conclusion and Outlook; References; 6 Metrological Large Range Scanning Force Microscope Applicable for Traceable Calibration of Surface Textures; 6.1 Introduction; 6.2 Instrumentation; 6.2.1 Principle; 6.2.2 Metrological Properties; 6.2.3 Traceability; 6.2.4 Specially Designed Features 327 $a6.3 Measurement Result of a 2D-Grating Standard6.3.1 Measurement Strategy; 6.3.2 Data Evaluation; 6.3.3 Measurement Result of the Mean Pitch Value; 6.3.4 Measurement of the Local Pitch Variation; 6.4 A Selected Measurement Result of a Microroughness Standard; 6.4.1 Measurement Result of a Glass Flatness Standard; 6.4.2 Measurement of a PTB Microroughness Standard; 6.4.3 Comparison of the Roughness Measurement Results Derived from SFM and Stylus Instruments Using Gaussian Filter; 6.4.4 Comparison Using Morphological Filters; 6.4.5 Evaluation Results Using PTB Reference Software 327 $a6.5 Outlook and Conclusion 330 $aThe quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar ""NanoScale 2004"" (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscal 606 $aMicrostructure$xMeasurement$vCongresses 606 $aNanostructured materials$xMeasurement$vCongresses 606 $aScientific apparatus and instruments$xCalibration$vCongresses 606 $aStereology$vCongresses 615 0$aMicrostructure$xMeasurement 615 0$aNanostructured materials$xMeasurement 615 0$aScientific apparatus and instruments$xCalibration 615 0$aStereology 676 $a620.50287 701 $aKoenders$b Ludger$01619525 701 $aWilkening$b Gu?nter$01619526 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910830318003321 996 $aNanoscale calibration standards and methods$93951818 997 $aUNINA