LEADER 01685oam  2200433zu 450 
001 9910147095303321
005 20210806235957.0
010   $a0-7381-3754-5
024 7 $a10.1109/IEEESTD.1997.82353
035   $a(CKB)1000000000035122
035   $a(SSID)ssj0000630456
035   $a(PQKBManifestationID)12233519
035   $a(PQKBTitleCode)TC0000630456
035   $a(PQKBWorkID)10744524
035   $a(PQKB)10851766
035   $a(NjHacI)991000000000035122
035   $a(EXLCZ)991000000000035122
100   $a20160829d1997      uy              
101 0 $aeng
135   $aur|||||||||||
181   $ctxt
182   $cc
183   $acr
200 00$aIEEE ABBET Standard for Test Equipment Description Language (TEDL): 993-1997
210 31$a[Place of publication not identified]$cIEEE$d1997
215   $a1 online resource
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a1-55937-915-4 
330   $aA language useful for describing automatic test equipment (ATE) instrumentation and configurations, as well as interface test adapters (ITA), is defined. Principally intended for testing environments using the ATLAS test language, TEDL can also be used to describe instrumentation in non-ATLAS environments.
606   $aComputer hardware description languages
606   $aATLAS (Computer program language)
615  0$aComputer hardware description languages.
615  0$aATLAS (Computer program language)
676   $a621.392
801  0$bPQKB
906   $aDOCUMENT
912   $a9910147095303321
996   $aIEEE ABBET Standard for Test Equipment Description Language (TEDL): 993-1997$92573326
997   $aUNINA