LEADER 01726oam 2200433zu 450 001 9910147054503321 005 20210807000307.0 010 $a0-7381-4585-8 024 7 $a10.1109/IEEESTD.1990.82369 035 $a(CKB)1000000000035309 035 $a(SSID)ssj0000996645 035 $a(PQKBManifestationID)12458313 035 $a(PQKBTitleCode)TC0000996645 035 $a(PQKBWorkID)10988026 035 $a(PQKB)10642883 035 $a(NjHacI)991000000000035309 035 $a(EXLCZ)991000000000035309 100 $a20160829d1990 uy 101 0 $aeng 135 $aur||||||||||| 181 $ctxt 182 $cc 183 $acr 200 10$aIEEE Std 993-1990, IEEE Trial-Use Standard for Test Equipment Description Language (TEDL 210 31$a[Place of publication not identified]$cIEEE$d1990 215 $a1 online resource (96 pages) 300 $aBibliographic Level Mode of Issuance: Monograph 311 $a1-55937-029-7 330 $aIEEE Std 993-1990, IEEE Trial-Use Standard for Test Equipment Description Language (TEDL), defines a language useful for describing automatic test equipment (ATE) instrumentation and configurations, as well as interface test adapters (ITA). Principally intended for testing environments using the ATLAS test language, TEDL can also be used to describe instrumentation in non-ATLAS environments. 606 $aElectric testing 606 $aElectrical engineering 615 0$aElectric testing. 615 0$aElectrical engineering. 676 $a621.37 801 0$bPQKB 906 $aDOCUMENT 912 $a9910147054503321 996 $aIEEE Std 993-1990, IEEE Trial-Use Standard for Test Equipment Description Language (TEDL$92575484 997 $aUNINA