LEADER 01709oam  2200493zu 450 
001 9910146829703321
005 20210806235803.0
010   $a1-5090-9767-8
035   $a(CKB)1000000000022601
035   $a(SSID)ssj0000396666
035   $a(PQKBManifestationID)12120027
035   $a(PQKBTitleCode)TC0000396666
035   $a(PQKBWorkID)10334531
035   $a(PQKB)11539136
035   $a(EXLCZ)991000000000022601
100   $a20160829d2005      uy 
101 0 $aeng
181   $ctxt
182   $cc
183   $acr
200 10$a2005 IEEE International Test Conference (ITC) : 8-10 November, 2005, Austin, TX
210 31$a[Place of publication not identified]$cInstitute of Electrical and Electronics Engineers$d2005
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7803-9038-5 
606   $aIntegrated circuits$xTesting$vCongresses
606   $aSemiconductors$xTesting$vCongresses
606   $aElectronics$vCongresses
606   $aElectrical Engineering$2HILCC
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
615  0$aIntegrated circuits$xTesting
615  0$aSemiconductors$xTesting
615  0$aElectronics
615  7$aElectrical Engineering
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
676   $a621.3815/48
712 02$aInstitute of Electrical and Electronics Engineers
712 12$aInternational Test Conference
801  0$bPQKB
906   $aPROCEEDING
912   $a9910146829703321
996   $a2005 IEEE International Test Conference (ITC) : 8-10 November, 2005, Austin, TX$92382075
997   $aUNINA