LEADER 01888oam  2200481zu 450 
001 9910146691303321
005 20210807002838.0
010   $a1-5090-8857-1
035   $a(CKB)1000000000524994
035   $a(SSID)ssj0000393964
035   $a(PQKBManifestationID)12091969
035   $a(PQKBTitleCode)TC0000393964
035   $a(PQKBWorkID)10379728
035   $a(PQKB)10822380
035   $a(EXLCZ)991000000000524994
100   $a20160829d2007      uy 
101 0 $aeng
181   $ctxt
182   $cc
183   $acr
200 10$aDFT 2007 : 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 26-28 September, 2007, Rome, Italy
210 31$a[Place of publication not identified]$cIEEE Computer Society Press$d2007
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7695-2885-6 
606   $aIntegrated circuits$xDesign and construction$xVery large scale integration$vCongresses
606   $aFault-tolerant computing$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aElectrical Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
615  0$aIntegrated circuits$xDesign and construction$xVery large scale integration
615  0$aFault-tolerant computing
615  7$aElectrical & Computer Engineering
615  7$aElectrical Engineering
615  7$aEngineering & Applied Sciences
676   $a621.39/5
702   $aBolchini$b Cristiana
712 02$aIEEE Computer Society
712 12$aIEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
801  0$bPQKB
906   $aPROCEEDING
912   $a9910146691303321
996   $aDFT 2007 : 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 26-28 September, 2007, Rome, Italy$92357283
997   $aUNINA