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101 0 $aeng
181   $ctxt
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183   $acr
200 10$a2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005
210 31$a[Place of publication not identified]$cIEEE Electron Devices Society$d2005
300   $aBibliographic Level Mode of Issuance: Monograph
311 08$a9780780389922 
311 08$a0780389921 
606   $aIntegrated circuits$xReliability$vCongresses
606   $aIntegrated circuits$xReliability$xWafer-scale integration$vCongresses
615  0$aIntegrated circuits$xReliability
615  0$aIntegrated circuits$xReliability$xWafer-scale integration
712 02$aIEEE Reliability Society
712 02$aIEEE Electron Devices Society
712 12$aInternational Integrated Reliability Workshop
801  0$bPQKB
906   $aPROCEEDING
912   $a9910146457403321
996   $a2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005$92539079
997   $aUNINA