LEADER 05544nam 2200769 a 450 001 9910145754703321 005 20200520144314.0 010 $a9786610274963 010 $a9781280274961 010 $a1280274964 010 $a9780470020456 010 $a0470020458 010 $a9781601195593 010 $a1601195591 010 $a9780470020463 010 $a0470020466 035 $a(CKB)1000000000018862 035 $a(EBL)210578 035 $a(OCoLC)77503614 035 $a(SSID)ssj0000072543 035 $a(PQKBManifestationID)11116038 035 $a(PQKBTitleCode)TC0000072543 035 $a(PQKBWorkID)10094538 035 $a(PQKB)10714268 035 $a(MiAaPQ)EBC210578 035 $a(Au-PeEL)EBL210578 035 $a(CaPaEBR)ebr10113965 035 $a(CaONFJC)MIL27496 035 $a(OCoLC)50270121 035 $a(FINmELB)ELB177700 035 $a(Perlego)2764170 035 $a(EXLCZ)991000000000018862 100 $a20040519d2004 uy 0 101 0 $aeng 135 $aurcn||||||||| 181 $ctxt 182 $cc 183 $acr 200 00$aMicrowave electronics $emeasurement and materials characterisation /$fL. F. Chen ... [et al.] 205 $a1st ed. 210 $aChichester $cJohn Wiley$dc2004 215 $a1 online resource (553 p.) 300 $aDescription based upon print version of record. 311 08$a9780470844922 311 08$a0470844922 320 $aIncludes bibliographical references and index. 327 $aMicrowave Electronics; Contents; Preface; 1 Electromagnetic Properties of Materials; 1.1 Materials Research and Engineering at Microwave Frequencies; 1.2 Physics for Electromagnetic Materials; 1.2.1 Microscopic scale; 1.2.2 Macroscopic scale; 1.3 General Properties of Electromagnetic Materials; 1.3.1 Dielectric materials; 1.3.2 Semiconductors; 1.3.3 Conductors; 1.3.4 Magnetic materials; 1.3.5 Metamaterials; 1.3.6 Other descriptions of electromagnetic materials; 1.4 Intrinsic Properties and Extrinsic Performances of Materials; 1.4.1 Intrinsic properties; 1.4.2 Extrinsic performances 327 $aReferences 2 Microwave Theory and Techniques for Materials Characterization; 2.1 Overview of the Microwave Methods for the Characterization of Electromagnetic Materials; 2.1.1 Nonresonant methods; 2.1.2 Resonant methods; 2.2 Microwave Propagation; 2.2.1 Transmission-line theory; 2.2.2 Transmission Smith charts; 2.2.3 Guided transmission lines; 2.2.4 Surface-wave transmission lines; 2.2.5 Free space; 2.3 Microwave Resonance; 2.3.1 Introduction; 2.3.2 Coaxial resonators; 2.3.3 Planar-circuit resonators; 2.3.4 Waveguide resonators; 2.3.5 Dielectric resonators; 2.3.6 Open resonators 327 $a2.4 Microwave Network 2.4.1 Concept of microwave network; 2.4.2 Impedance matrix and admittance matrix; 2.4.3 Scattering parameters; 2.4.4 Conversions between different network parameters; 2.4.5 Basics of network analyzer; 2.4.6 Measurement of reflection and transmission properties; 2.4.7 Measurement of resonant properties; References; 3 Reflection Methods; 3.1 Introduction; 3.1.1 Open-circuited reflection; 3.1.2 Short-circuited reflection; 3.2 Coaxial-line Reflection Method; 3.2.1 Open-ended apertures; 3.2.2 Coaxial probes terminated into layered materials 327 $a3.2.3 Coaxial-line-excited monopole probes 3.2.4 Coaxial lines open into circular waveguides; 3.2.5 Shielded coaxial lines; 3.2.6 Dielectric-filled cavity adapted to the end of a coaxial line; 3.3 Free-space Reflection Method; 3.3.1 Requirements for free-space measurements; 3.3.2 Short-circuited reflection method; 3.3.3 Movable metal-backing method; 3.3.4 Bistatic reflection method; 3.4 Measurement of Both Permittivity and Permeability Using Reflection Methods; 3.4.1 Two-thickness method; 3.4.2 Different-position method; 3.4.3 Combination method; 3.4.4 Different backing method 327 $a3.4.5 Frequency-variation method 3.4.6 Time-domain method; 3.5 Surface Impedance Measurement; 3.6 Near-field Scanning Probe; References; 4 Transmission/Reflection Methods; 4.1 Theory for Transmission/reflection Methods; 4.1.1 Working principle for transmission/reflection methods; 4.1.2 Nicolson-Ross-Weir (NRW) algorithm; 4.1.3 Precision model for permittivity determination; 4.1.4 Effective parameter method; 4.1.5 Nonlinear least-squares solution; 4.2 Coaxial Air-line Method; 4.2.1 Coaxial air lines with different diameters; 4.2.2 Measurement uncertainties; 4.2.3 Enlarged coaxial line 327 $a4.3 Hollow Metallic Waveguide Method 330 $aThe development of high speed, high frequency circuits and systems requires an understanding of the properties of materials functioning at the microwave level. This comprehensive reference sets out to address this requirement by providing guidance on the development of suitable measurement methodologies tailored for a variety of materials and application systems. Bringing together coverage of a broad range of techniques in one publication for the first time, this book: Provides a comprehensive introduction to microwave theory and microwave measurement techniques.Examines every 606 $aMicrowave devices 606 $aShortwave radio 615 0$aMicrowave devices. 615 0$aShortwave radio. 676 $a621.3813 676 $a621.381/3 701 $aChen$b Linfeng$0889291 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910145754703321 996 $aMicrowave electronics$91986772 997 $aUNINA