LEADER 01290oam  2200433zu 450 
001 9910145703603321
005 20241212215715.0
010   $a9781509090501
010   $a1509090509
010   $a9781424416554
010   $a1424416558
035   $a(CKB)1000000000711031
035   $a(SSID)ssj0000453875
035   $a(PQKBManifestationID)12203638
035   $a(PQKBTitleCode)TC0000453875
035   $a(PQKBWorkID)10487912
035   $a(PQKB)10319800
035   $a(NjHacI)991000000000711031
035   $a(EXLCZ)991000000000711031
100   $a20160829d2007      uy 
101 0 $aeng
135   $aur|||||||||||
181   $ctxt
182   $cc
183   $acr
200 10$a2007 IEEE International Workshop on Memory Technology, Design and Testing (MTDT)
210 31$a[Place of publication not identified]$cI E E E$d2007
215   $a1 online resource
300   $aBibliographic Level Mode of Issuance: Monograph
311 08$a9781424416561 
311 08$a1424416566 
606   $aRandom access memory
615  0$aRandom access memory.
676   $a004.5
801  0$bPQKB
906   $aPROCEEDING
912   $a9910145703603321
996   $a2007 IEEE International Workshop on Memory Technology, Design and Testing (MTDT)$92410547
997   $aUNINA