LEADER 01791oam 2200457zu 450 001 9910145691203321 005 20210807003133.0 010 $a1-5090-9617-5 035 $a(CKB)1000000000711160 035 $a(SSID)ssj0000395653 035 $a(PQKBManifestationID)12144179 035 $a(PQKBTitleCode)TC0000395653 035 $a(PQKBWorkID)10456853 035 $a(PQKB)11610667 035 $a(EXLCZ)991000000000711160 100 $a20160829d2006 uy 101 0 $aeng 181 $ctxt 182 $cc 183 $acr 200 10$a2006 International Workshop on Nano CMOS : proceedings : Jan. 30, 31, Feb. 1, 2006, TORAY Sougou Kensyu Center, 21-9 Suehiro, Mishima, Shizuoka, 411-0032 Japan 210 31$a[Place of publication not identified]$cIEEE Electron Devices Society$d2006 300 $aBibliographic Level Mode of Issuance: Monograph 311 $a1-4244-0603-X 606 $aMetal oxide semiconductors, Complementary$xDesign and construction$vCongresses 606 $aNanoelectronics$vCongresses 606 $aElectrical & Computer Engineering$2HILCC 606 $aEngineering & Applied Sciences$2HILCC 606 $aElectrical Engineering$2HILCC 615 0$aMetal oxide semiconductors, Complementary$xDesign and construction 615 0$aNanoelectronics 615 7$aElectrical & Computer Engineering 615 7$aEngineering & Applied Sciences 615 7$aElectrical Engineering 676 $a621.39/5 712 12$aInternational Workshop on Nano CMOS 801 0$bPQKB 906 $aPROCEEDING 912 $a9910145691203321 996 $a2006 International Workshop on Nano CMOS : proceedings : Jan. 30, 31, Feb. 1, 2006, TORAY Sougou Kensyu Center, 21-9 Suehiro, Mishima, Shizuoka, 411-0032 Japan$92514204 997 $aUNINA