LEADER 01347oam  2200409zu 450 
001 9910145625903321
005 20210806235942.0
010   $a1-5090-9294-3
035   $a(CKB)1000000000278334
035   $a(SSID)ssj0000454307
035   $a(PQKBManifestationID)12173435
035   $a(PQKBTitleCode)TC0000454307
035   $a(PQKBWorkID)10397793
035   $a(PQKB)10469411
035   $a(NjHacI)991000000000278334
035   $a(EXLCZ)991000000000278334
100   $a20160829d2006      uy 
101 0 $aeng
135   $aur|||||||||||
181   $ctxt
182   $cc
183   $acr
200 00$a2006 IEEE International Conference on Microelectronic Test Structures
210 31$a[Place of publication not identified]$cI E E E$d2006
215   $a1 online resource (xiii, 229 pages) $cillustrations
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a1-4244-0167-4 
606   $aElectronic apparatus and appliances$xTesting$vCongresses
606   $aSemiconductors$xTesting$vCongresses
615  0$aElectronic apparatus and appliances$xTesting
615  0$aSemiconductors$xTesting
676   $a621.3810287
801  0$bPQKB
906   $aPROCEEDING
912   $a9910145625903321
996   $a2006 IEEE International Conference on Microelectronic Test Structures$92529740
997   $aUNINA