LEADER 03644nam 2200673Ia 450 001 9910791736803321 005 20230802012635.0 010 $a0-674-06535-2 010 $a0-674-06993-5 024 7 $a10.4159/harvard.9780674065352 035 $a(CKB)2560000000082837 035 $a(EBL)3301101 035 $a(OCoLC)794670868 035 $a(SSID)ssj0000693068 035 $a(PQKBManifestationID)11427219 035 $a(PQKBTitleCode)TC0000693068 035 $a(PQKBWorkID)10649273 035 $a(PQKB)11728399 035 $a(MiAaPQ)EBC3301101 035 $a(DE-B1597)178202 035 $a(OCoLC)840440474 035 $a(DE-B1597)9780674065352 035 $a(Au-PeEL)EBL3301101 035 $a(CaPaEBR)ebr10568045 035 $a(EXLCZ)992560000000082837 100 $a20111027d2012 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aSeeing through race$b[electronic resource] /$fW. J. T. Mitchell 210 $aCambridge, Mass $cHarvard University Press$dc2012 215 $a1 online resource (248 p.) 225 0 $aThe W. E. B. Du Bois Lectures 300 $aDescription based upon print version of record. 311 $a0-674-05981-6 320 $aIncludes bibliographical references and index. 327 $t Frontmatter -- $tCONTENTS -- $tILLUSTRATIONS -- $tPREFACE -- $tPart I. Teachable Moments -- $tLecture 1. THE MOMENT OF THEORY -- $tLecture 2. THE MOMENT OF BLACKNESS -- $tLecture 3. THE SEMITIC MOMENT -- $tPart II. Teachable Objects -- $tChapter 1. GILO'S WALL AND CHRISTO'S GATES -- $tChapter 2. BINATIONAL ALLEGORY -- $tChapter 3. MIGRATION, LAW, AND THE IMAGE -- $tChapter 4. IDOLATRY -- $tCONCLUSION: MONEY AND MASQUERADE -- $tNOTES -- $tACKNOWLEDGMENTS -- $tINDEX 330 $aAccording to W. J. T. Mitchell, a "color-blind" post-racial world is neither achievable nor desirable. Against popular claims that race is an outmoded construct that distracts from more important issues, Mitchell contends that race remains essential to our understanding of social reality. Race is not simply something to be seen but is among the fundamental media through which we experience human otherness. Race also makes racism visible and is thus our best weapon against it.The power of race becomes most apparent at times when pedagogy fails, the lesson is unclear, and everyone has something to learn. Mitchell identifies three such moments in America's recent racial history. First is the post-Civil Rights moment of theory, in which race and racism have been subject to renewed philosophical inquiry. Second is the moment of blackness, epitomized by the election of Barack Obama and accompanying images of blackness in politics and popular culture. Third is the "Semitic Moment" in Israel-Palestine, where race and racism converge in new forms of anti-Semitism and Islamophobia. Mitchell brings visual culture, iconology, and media studies to bear on his discussion of these critical turning points in our understanding of the relation between race and racism. 410 0$aW.E.B. du Bois Lectures 606 $aIdolatry 606 $aRace$xReligious aspects 606 $aRace 606 $aRacism 615 0$aIdolatry. 615 0$aRace$xReligious aspects. 615 0$aRace. 615 0$aRacism. 676 $a305.8 686 $aLB 31960$2rvk 700 $aMitchell$b W. J. T$g(William John Thomas),$f1942-$01484712 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910791736803321 996 $aSeeing through race$93828568 997 $aUNINA LEADER 01402oam 2200433zu 450 001 9910145625903321 005 20241212215427.0 010 $a9781509092949 010 $a1509092943 035 $a(CKB)1000000000278334 035 $a(SSID)ssj0000454307 035 $a(PQKBManifestationID)12173435 035 $a(PQKBTitleCode)TC0000454307 035 $a(PQKBWorkID)10397793 035 $a(PQKB)10469411 035 $a(NjHacI)991000000000278334 035 $a(EXLCZ)991000000000278334 100 $a20160829d2006 uy 101 0 $aeng 135 $aur||||||||||| 181 $ctxt 182 $cc 183 $acr 200 00$a2006 IEEE International Conference on Microelectronic Test Structures 210 31$a[Place of publication not identified]$cI E E E$d2006 215 $a1 online resource (xiii, 229 pages) $cillustrations 300 $aBibliographic Level Mode of Issuance: Monograph 311 08$a9781424401673 311 08$a1424401674 606 $aElectronic apparatus and appliances$xTesting$vCongresses 606 $aSemiconductors$xTesting$vCongresses 615 0$aElectronic apparatus and appliances$xTesting 615 0$aSemiconductors$xTesting 676 $a621.3810287 801 0$bPQKB 906 $aPROCEEDING 912 $a9910145625903321 996 $a2006 IEEE International Conference on Microelectronic Test Structures$92529740 997 $aUNINA