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200 10$aEleventh IEEE European Test Symposium : ETS 2006 : proceedings : 21-24 May, 2006, [Hilton Hotel] Southampton, United Kingdom
210 31$a[Place of publication not identified]$cIEEE Computer Society Press$d2006
300   $aBibliographic Level Mode of Issuance: Monograph
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606   $aIntegrated circuits$xTesting$vCongresses
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606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
615  0$aIntegrated circuits$xTesting
615  7$aElectrical Engineering
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
676   $a621.3815/48
712 02$aIEEE Computer Society Technical Council on Test Technology.
712 12$aIEEE European Test Symposium
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912   $a9910145618803321
996   $aEleventh IEEE European Test Symposium : ETS 2006 : proceedings : 21-24 May, 2006, Southampton, United Kingdom$92351969
997   $aUNINA