LEADER 02869oam 2200457zu 450 001 9910145453503321 005 20241212215415.0 010 $a9781509098286 010 $a1509098283 035 $a(CKB)1000000000278061 035 $a(SSID)ssj0000451820 035 $a(PQKBManifestationID)12211420 035 $a(PQKBTitleCode)TC0000451820 035 $a(PQKBWorkID)10464032 035 $a(PQKB)11082852 035 $a(NjHacI)991000000000278061 035 $a(EXLCZ)991000000000278061 100 $a20160829d2006 uy 101 0 $aeng 135 $aur||||||||||| 181 $ctxt 182 $cc 183 $acr 200 10$a24th IEEE VLSI Test Symposium (VTS 2006): 30 April - 04 May 2006/Berkeley, California 210 31$a[Place of publication not identified]$cIEEE Computer Society Press$d2006 215 $a1 online resource 300 $aBibliographic Level Mode of Issuance: Monograph 311 08$a9780769525143 311 08$a0769525148 327 $aProceedings. 24th IEEE VLSI Test Symposium -- 24th IEEE VLSI Test Symposium - Title -- 24th IEEE VLSI Test Symposium - Copyright -- 24th IEEE Symposium on Reliable Distributed Systems - Table of contents -- Forward -- Organizing Committee -- Program Committee -- Reviewers -- Acknowledgments -- Test Technology Technical Council (TTTC) -- Awards -- Test Technology Educational Progam (TTEP) Tutorials -- The impacts of untestable defects on transition fault testing -- Low-cost scan-based delay testing of latch-based circuits with time borrowing -- Path delay fault simulation on large industrial designs -- A scheme for on-chip timing characterization -- BIST for network-on-chip interconnect infrastructures. 330 $aAnnotation VTS 2006 focuses on innovation in the field of testing of integrated circuits and systems. VTS looks at the many trends and challenges in the semiconductor design and manufacturing industries with papers covering wide range of interests, including basic and continuing education for test professionals, the latest research developments, new directions and hot topics in test, and expert perspectives on current issues. The proceedings explores high speed interconnect testing, analog and mixed signal testing, delay testing, flash and memory testing, RF testing, yield analysis, nanoscale testing, IDDQ, MEMS, and wireless testing. 606 $aIntegrated circuits$xVery large scale integration$xTesting 606 $aIntegrated circuits$xVery large scale integration$xTesting$vCongresses 615 0$aIntegrated circuits$xVery large scale integration$xTesting. 615 0$aIntegrated circuits$xVery large scale integration$xTesting 676 $a621.395 801 0$bPQKB 906 $aPROCEEDING 912 $a9910145453503321 996 $a24th IEEE VLSI Test Symposium (VTS 2006): 30 April - 04 May 2006$92384931 997 $aUNINA