LEADER 01515oam 2200481zu 450 001 9910145431403321 005 20241212215606.0 010 $a9781509077847 010 $a1509077847 035 $a(CKB)1000000000710006 035 $a(SSID)ssj0000453227 035 $a(PQKBManifestationID)12149014 035 $a(PQKBTitleCode)TC0000453227 035 $a(PQKBWorkID)10472543 035 $a(PQKB)11272082 035 $a(WaSeSS)IndRDA00093488 035 $a(EXLCZ)991000000000710006 100 $a20160829d2008 uy 101 0 $aeng 135 $aur||||||||||| 181 $ctxt 182 $cc 183 $acr 200 10$a2008 IEEE International Workshop on Microprocessor Test and Verification 210 31$a[Place of publication not identified]$cIEEE$d2008 215 $a1 online resource (110 pages) 300 $aBibliographic Level Mode of Issuance: Monograph 311 08$a9780769535814 311 08$a076953581X 311 08$a9781424436828 311 08$a1424436826 606 $aMicroprocessors$xTesting$vCongresses 606 $aSystems on a chip$xTesting$vCongresses 606 $aIntegrated circuits$xVerification$vCongresses 615 0$aMicroprocessors$xTesting 615 0$aSystems on a chip$xTesting 615 0$aIntegrated circuits$xVerification 702 $aIEEE Staff 801 0$bPQKB 906 $aPROCEEDING 912 $a9910145431403321 996 $a2008 IEEE International Workshop on Microprocessor Test and Verification$92385870 997 $aUNINA