LEADER 01455oam 2200469zu 450 001 9910145403203321 005 20241212215707.0 010 $a9781509068869 010 $a1509068864 010 $a9781424428892 010 $a1424428890 035 $a(CKB)1000000000710476 035 $a(SSID)ssj0000453087 035 $a(PQKBManifestationID)12171164 035 $a(PQKBTitleCode)TC0000453087 035 $a(PQKBWorkID)10481024 035 $a(PQKB)10002212 035 $a(NjHacI)991000000000710476 035 $a(EXLCZ)991000000000710476 100 $a20160829d2009 uy 101 0 $aeng 135 $aur||||||||||| 181 $ctxt 182 $cc 183 $acr 200 10$a2009 IEEE International Reliability Physics Symposium 210 31$a[Place of publication not identified]$cI E E E$d2009 215 $a1 online resource (1010 pages) 300 $aBibliographic Level Mode of Issuance: Monograph 311 08$a9781424428885 311 08$a1424428882 606 $aElectronic apparatus and appliances$xReliability$vCongresses 606 $aIntegrated circuits$xReliability$vCongresses 615 0$aElectronic apparatus and appliances$xReliability 615 0$aIntegrated circuits$xReliability 676 $a621.381 702 $aIEEE Staff 801 0$bPQKB 906 $aPROCEEDING 912 $a9910145403203321 996 $a2009 IEEE International Reliability Physics Symposium$92516536 997 $aUNINA