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200 10$a2008 IEEE 14th International Mixed-signals, Sensors, and Systems Test Workshop : Vancouver, BC, Canada, 18-20 June 2008
210 31$a[Place of publication not identified]$cIEEE$d2008
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a1-4244-2395-3 
606   $aElectronic apparatus and appliances$xTesting$vCongresses
606   $aBiosensors$vCongresses
606   $aDetectors$vCongresses
606   $aSignal processing$vCongresses
606   $aAutomatic test equipment$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aElectronic apparatus and appliances$xTesting
615  0$aBiosensors
615  0$aDetectors
615  0$aSignal processing
615  0$aAutomatic test equipment
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
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712 02$aInstitute of Electrical and Electronics Engineers
712 12$aIEEE International Mixed-Signals, Sensors, and Systems Test Workshop
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996   $a2008 IEEE 14th International Mixed-signals, Sensors, and Systems Test Workshop : Vancouver, BC, Canada, 18-20 June 2008$92385632
997   $aUNINA