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200 10$a4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) $e23-25 January 2008, Hong Kong, China /$fIEEE Computer Society
210  1$aPiscataway, New Jersey :$cInstitute of Electrical and Electronics Engineers,$d2008.
215   $a1 online resource (84 pages)
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7695-3110-5 
517 1 $aFourth Institute of Electrical and Electronics Engineers International Symposium on Electronic Design, Test and Applications (delta 2008)
606   $aElectronics$xDesign$vCongresses
606   $aElectronics$xTesting$vCongresses
615  0$aElectronics$xDesign
615  0$aElectronics$xTesting
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701   $aOsseiran$b Adam$01238040
712 02$aIEEE Computer Society,
712 12$aIEEE International Symposium on Electronic Design, Test and Applications
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996   $a4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008)$92873447
997   $aUNINA