LEADER 00947nam a2200265 i 4500 001 991000943219707536 005 20020502181423.0 008 010508s|||| it ||| | ita 020 $a8815073892 035 $ab11440740-39ule_inst 035 $aPRUMB51924$9ExL 040 $aDip. SSSC$bita 100 1 $aPremm, Hanns J.$0526575 245 14$aGli Aztechi /$cHanns J. Prem 260 $aBologna :$bIl mulino,$c2000 300 $a144 p. ;$c21 cm. 490 0 $aUniversale paperbacks Il mulino ;$v372 650 4$aAztechi 907 $a.b11440740$b01-03-17$c01-07-02 912 $a991000943219707536 945 $aLE005 330 PRE02. 01$g1$i2005000127854$lle005$o-$pE0.00$q-$rl$s- $t0$u4$v1$w4$x0$y.i12010819$z09-12-02 945 $aLE021 SOC22C20$g1$i2021000045073$lle021$o-$pE0.00$q-$rl$s- $t0$u0$v0$w0$x0$y.i1162579x$z01-07-02 996 $aAztechi$9819956 997 $aUNISALENTO 998 $ale005$ale021$b01-01-01$cm$da $e-$fita$git $h4$i2 LEADER 01756nam 2200469 450 001 9910145113403321 005 20230721004443.0 010 $a1-5090-7977-7 035 $a(CKB)1000000000695743 035 $a(SSID)ssj0000394404 035 $a(PQKBManifestationID)12172025 035 $a(PQKBTitleCode)TC0000394404 035 $a(PQKBWorkID)10387929 035 $a(PQKB)11496523 035 $a(WaSeSS)IndRDA00124306 035 $a(EXLCZ)991000000000695743 100 $a20200606d2008 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt 182 $cc 183 $acr 200 10$a4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) $e23-25 January 2008, Hong Kong, China /$fIEEE Computer Society 210 1$aPiscataway, New Jersey :$cInstitute of Electrical and Electronics Engineers,$d2008. 215 $a1 online resource (84 pages) 300 $aBibliographic Level Mode of Issuance: Monograph 311 $a0-7695-3110-5 517 1 $aFourth Institute of Electrical and Electronics Engineers International Symposium on Electronic Design, Test and Applications (delta 2008) 606 $aElectronics$xDesign$vCongresses 606 $aElectronics$xTesting$vCongresses 615 0$aElectronics$xDesign 615 0$aElectronics$xTesting 676 $a621.381 701 $aOsseiran$b Adam$01238040 712 02$aIEEE Computer Society, 712 12$aIEEE International Symposium on Electronic Design, Test and Applications 801 0$bWaSeSS 801 1$bWaSeSS 906 $aPROCEEDING 912 $a9910145113403321 996 $a4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008)$92873447 997 $aUNINA LEADER 01554oas 2200613 a 450 001 9910172105603321 005 20251105213014.0 011 $a1743-6761 035 $a(DE-599)ZDB2176885-7 035 $a(OCoLC)60352135 035 $a(CONSER) 2006264568 035 $a(CKB)1000000000018696 035 $a(EXLCZ)991000000000018696 100 $a20050512a20059999 sy 101 0 $aeng 135 $aurcnu|||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aAdvances in applied ceramics 210 $aLondon $cManey Pub.$dİ2005- 300 $aRefereed/Peer-reviewed 300 $aTitle from JPG cover (publisher's Web site, viewed May 12, 2005). 311 08$a1743-6753 517 1 $aAAC 606 $aCeramics$vPeriodicals 606 $aCeramics$2fast$3(OCoLC)fst00851090 606 $aCe?ramique industrielle$vPe?riodiques 608 $aPeriodicals.$2fast 615 0$aCeramics 615 7$aCeramics. 615 6$aCe?ramique industrielle 712 02$aInstitute of Materials, Minerals, and Mining 801 0$bBUF 801 1$bBUF 801 2$bSBH 801 2$bCUD 801 2$bJPG 801 2$bOCLCE 801 2$bOCLCQ 801 2$bOCLCF 801 2$bOCLCO 801 2$bOCLCQ 801 2$bBUF 801 2$bDLC 801 2$bOCLCQ 801 2$bUAB 801 2$bOCLCL 801 2$bXND 801 2$bUEJ 906 $aJOURNAL 912 $a9910172105603321 996 $aAdvances in applied ceramics$92422233 997 $aUNINA