LEADER 03417nam 2200565 450 001 9910143966103321 005 20210512134615.0 010 $a0-387-34758-5 024 7 $a10.1007/978-0-387-40093-8 035 $a(CKB)1000000000547033 035 $a(SSID)ssj0000320486 035 $a(PQKBManifestationID)11237909 035 $a(PQKBTitleCode)TC0000320486 035 $a(PQKBWorkID)10249237 035 $a(PQKB)10480747 035 $a(DE-He213)978-0-387-34758-5 035 $a(MiAaPQ)EBC3063896 035 $a(MiAaPQ)EBC6362086 035 $a(PPN)132863138 035 $a(EXLCZ)991000000000547033 100 $a20210301d2008 uy 0 101 0 $aeng 135 $aurnn#008mamaa 181 $ctxt 182 $cc 183 $acr 200 10$aTransmission electron microscopy $ephysics of image formation /$fLudwig Reimer, Helmut Kohl 205 $aFifth edition. 210 1$aNew York, New York :$cSpringer,$d[2008] 210 4$dİ2008 215 $a1 online resource (XVI, 590 p. 276 illus.) 225 1 $aSpringer series in optical sciences ;$v36 300 $aBibliographic Level Mode of Issuance: Monograph 311 $a0-387-40093-1 320 $aIncludes bibliographical references (p. [491]-574) and index. 327 $aParticle Optics of Electrons -- Wave Optics of Electrons -- Elements of a Transmission Electron Microscope -- Electron?Specimen Interactions. -- Scattering and Phase Contrast -- Theory of Electron Diffraction -- Electron-Diffraction Modesand Applications . -- Imaging of Crystalline Specimens and Their Defects. -- Elemental Analysis by X-ray and Electron Energy-Loss Spectroscopy. -- Specimen Damage by Electron Irradiation. 330 $aTransmission Electron Microscopy: Physics of Image Formation presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray microanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration correction and energy filtering; moreover, the topics introduced in the fourth edition have been updated. Transmission Electron Microscopy: Physics of Image Formation is written for scientists and application engineers in fields such as physics, chemistry, mineralogy, materials science and biology. Researchers, students, and other users of a transmission electron microscope can also benefit from this text. 410 0$aSpringer series in optical sciences ;$v36. 606 $aTransmission electron microscopy 615 0$aTransmission electron microscopy. 676 $a502.825 700 $aReimer$b Ludwig$f1928-$014910 702 $aKohl$b Helmut 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910143966103321 996 $aTransmission electron microscopy$9192570 997 $aUNINA