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010   $a3-540-88588-9
024 7 $a10.1007/978-3-540-88588-7
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035   $a(PQKBTitleCode)TC0000320725
035   $a(PQKBWorkID)10249736
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035   $a(DE-He213)978-3-540-88588-7
035   $a(MiAaPQ)EBC3063762
035   $a(PPN)131119761
035   $a(EXLCZ)991000000000547093
100   $a20100301d2009      u|             0
101 0 $aeng
135   $aurnn#008mamaa
181   $ctxt
182   $cc
183   $acr
200 10$aX-ray and Neutron Reflectivity$b[electronic resource] $ePrinciples and Applications /$fedited by Jean Daillant, Alain Gibaud
205   $a1st ed. 2009.
210  1$aBerlin, Heidelberg :$cSpringer Berlin Heidelberg :$cImprint: Springer,$d2009.
215   $a1 online resource (XIV, 350 p.)
225 1 $aLecture Notes in Physics,$x0075-8450 ;$v770
300   $aPrevious ed.: 1999.
311   $a3-540-88587-0 
320   $aIncludes bibliographical references and index.
327   $aThe Interaction of X-Rays (and Neutrons) with Matter -- Statistical Aspects of Wave Scattering at Rough Surfaces -- Specular Reflectivity from Smooth and Rough Surfaces -- Diffuse Scattering -- Neutron Reflectometry -- X-Ray Reflectivity by Rough Multilayers -- Grazing Incidence Small-Angle X-Ray Scattering from Nanostructures.
330   $aThis book is the first comprehensive introduction to X-ray and neutron reflectivity techniques and illustrates them with many examples. After a pedagogical introduction on the interaction of X-rays and neutrons with matter, the interplay between the statistics of rough surfaces and interfaces and the scattering of radiation is considered in detail. Specular reflectivity and diffuse scattering are discussed next , in chapters 3 and 4 . The approximations are rigorously introduced and many experimental effects are discussed. The specific aspects of neutron reflectivity require separate treatment, given in chapter 5. Chapter 6 turns to X-ray reflectivity by rough multilayers. Eventually, chapter 7 introduces and discusses the by now well-established method of grazing incidence small angle X-ray scattering to investigate nanostructures. For the second edition, the material has been completely reorganized so as to meet the demand for a modern multi-author textbook for PhD students and young researchers. All chapters have further been thoroughly revised, updated and, where appropriate, suitably augmented. The first edition was been published as Lect. Notes Phys. m58 in the same series.
410  0$aLecture Notes in Physics,$x0075-8450 ;$v770
606   $aSolid state physics
606   $aSpectroscopy
606   $aMicroscopy
606   $aMaterials?Surfaces
606   $aThin films
606   $aMaterials science
606   $aSolid State Physics$3https://scigraph.springernature.com/ontologies/product-market-codes/P25013
606   $aSpectroscopy and Microscopy$3https://scigraph.springernature.com/ontologies/product-market-codes/P31090
606   $aSurfaces and Interfaces, Thin Films$3https://scigraph.springernature.com/ontologies/product-market-codes/Z19000
606   $aCharacterization and Evaluation of Materials$3https://scigraph.springernature.com/ontologies/product-market-codes/Z17000
615  0$aSolid state physics.
615  0$aSpectroscopy.
615  0$aMicroscopy.
615  0$aMaterials?Surfaces.
615  0$aThin films.
615  0$aMaterials science.
615 14$aSolid State Physics.
615 24$aSpectroscopy and Microscopy.
615 24$aSurfaces and Interfaces, Thin Films.
615 24$aCharacterization and Evaluation of Materials.
676   $a539.7222
702   $aDaillant$b Jean$4edt$4http://id.loc.gov/vocabulary/relators/edt
702   $aGibaud$b Alain$4edt$4http://id.loc.gov/vocabulary/relators/edt
906   $aBOOK
912   $a9910143965603321
996   $aX-Ray and Neutron Reflectivity$9374544
997   $aUNINA