LEADER 05429nam 2200697 a 450 001 9910143313003321 005 20210209112150.0 010 $a1-280-84764-6 010 $a9786610847648 010 $a0-470-61240-1 010 $a0-470-39453-6 010 $a1-84704-571-5 035 $a(CKB)1000000000335560 035 $a(EBL)700732 035 $a(OCoLC)781251823 035 $a(SSID)ssj0000275603 035 $a(PQKBManifestationID)11234736 035 $a(PQKBTitleCode)TC0000275603 035 $a(PQKBWorkID)10219674 035 $a(PQKB)11688796 035 $a(MiAaPQ)EBC700732 035 $a(MiAaPQ)EBC262013 035 $a(Au-PeEL)EBL262013 035 $a(OCoLC)936814032 035 $a(PPN)156604035 035 $a(EXLCZ)991000000000335560 100 $a20061120d2007 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aX-ray diffraction by polycrystalline materials$b[electronic resource] /$fRene? Guinebretie?re 210 $aLondon ;$aNewport Beach, CA $cISTE$d2007 215 $a1 online resource (385 p.) 225 1 $aISTE ;$vv.97 300 $aDescription based upon print version of record. 311 $a1-905209-21-5 320 $aIncludes bibliographical references (p. [319]-347) and index. 327 $aX-ray Diffraction by Polycrystalline Materials; Table of Contents; Preface; Acknowledgements; An Historical Introduction: The Discovery of X-rays and the First Studies in X-ray Diffraction; Part 1. Basic Theoretical Elements, Instrumentation and Classical Interpretations of the Results; Chapter 1. Kinematic and Geometric Theories of X-ray Diffraction; 1.1. Scattering by an atom; 1.1.1. Scattering by a free electron; 1.1.1.1. Coherent scattering: the Thomson formula; 1.1.1.2. Incoherent scattering: Compton scattering [COM 23]; 1.1.2. Scattering by a bound electron 327 $a1.1.3. Scattering by a multi-electron atom1.2. Diffraction by an ideal crystal; 1.2.1. A few elements of crystallography; 1.2.1.1. Direct lattice; 1.2.1.2. Reciprocal lattice; 1.2.2. Kinematic theory of diffraction; 1.2.2.1. Diffracted amplitude: structure factor and form factor; 1.2.2.2. Diffracted intensity; 1.2.2.3. Laue conditions [FRI 12]; 1.2.3. Geometric theory of diffraction; 1.2.3.1. Laue conditions; 1.2.3.2. Bragg's law [BRA 13b, BRA 15]; 1.2.3.3. The Ewald sphere; 1.3. Diffraction by an ideally imperfect crystal; 1.4. Diffraction by a polycrystalline sample 327 $aChapter 2. Instrumentation used for X-ray Diffraction2.1. The different elements of a diffractometer; 2.1.1. X-ray sources; 2.1.1.1. Crookes tubes; 2.1.1.2. Coolidge tubes; 2.1.1.3. High intensity tubes; 2.1.1.4. Synchrotron radiation; 2.1.2. Filters and monochromator crystals; 2.1.2.1. Filters; 2.1.2.2. Monochromator crystals; 2.1.2.3. Multi-layered monochromators or mirrors; 2.1.3. Detectors; 2.1.3.1. Photographic film; 2.1.3.2. Gas detectors; 2.1.3.3. Solid detectors; 2.2. Diffractometers designed for the study of powdered or bulk polycrystalline samples 327 $a2.2.1. The Debye-Scherrer and Hull diffractometer2.2.1.1. The traditional Debye-Scherrer and Hull diffractometer; 2.2.1.2. The modern Debye-Scherrer and Hill diffractometer: use of position sensitive detectors; 2.2.2. Focusing diffractometers: Seeman and Bohlin diffractometers; 2.2.2.1. Principle; 2.2.2.2. The different configurations; 2.2.3. Bragg-Brentano diffractometers; 2.2.3.1. Principle; 2.2.3.2. Description of the diffractometer; path of the X-ray beams; 2.2.3.3. Depth and irradiated volume; 2.2.4. Parallel geometry diffractometers; 2.2.5. Diffractometers equipped with plane detectors 327 $a2.3. Diffractometers designed for the study of thin films2.3.1. Fundamental problem; 2.3.1.1. Introduction; 2.3.1.2. Penetration depth and diffracted intensity; 2.3.2. Conventional diffractometers designed for the study of polycrystalline films; 2.3.3. Systems designed for the study of textured layers; 2.3.4. High resolution diffractometers designed for the study of epitaxial films; 2.3.5. Sample holder; 2.4. An introduction to surface diffractometry; Chapter 3. Data Processing, Extracting Information; 3.1. Peak profile: instrumental aberrations; 3.1.1. X-ray source: g1(?); 3.1.2. Slit: g2(?) 327 $a3.1.3. Spectral width: g3(?) 330 $aThis book presents a physical approach to the diffraction phenomenon and its applications in materials science.An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural ana 410 0$aISTE 606 $aX-rays$xDiffraction 606 $aCrystallography 615 0$aX-rays$xDiffraction. 615 0$aCrystallography. 676 $a548.83 676 $a548/.83 700 $aGuinebretiere$b Rene?$0960291 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910143313003321 996 $aX-ray diffraction by polycrystalline materials$92176577 997 $aUNINA