LEADER 02076oam 2200529zu 450 001 9910142739703321 005 20210807002715.0 010 $a1-5090-9743-0 035 $a(CKB)1000000000330895 035 $a(SSID)ssj0000395513 035 $a(PQKBManifestationID)12171116 035 $a(PQKBTitleCode)TC0000395513 035 $a(PQKBWorkID)10451715 035 $a(PQKB)11233415 035 $a(EXLCZ)991000000000330895 100 $a20160829d2005 uy 101 0 $aeng 181 $ctxt 182 $cc 183 $acr 200 10$aSixth International Workshop on Microprocessor Test and Verification : common challenges and solutions : MTV 2005 : proceedings : Austin, Texas, 3-4 November, 2005 210 31$a[Place of publication not identified]$cIEEE Computer Society$d2005 300 $aBibliographic Level Mode of Issuance: Monograph 311 $a0-7695-2627-6 606 $aMicroprocessors$xTesting$vCongresses 606 $aIntegrated circuits$xTesting$vCongresses 606 $aIntegrated circuits$xVerification$vCongresses 606 $aSystems on a chip$xTesting$vCongresses 606 $aElectrical & Computer Engineering$2HILCC 606 $aEngineering & Applied Sciences$2HILCC 606 $aElectrical Engineering$2HILCC 615 0$aMicroprocessors$xTesting 615 0$aIntegrated circuits$xTesting 615 0$aIntegrated circuits$xVerification 615 0$aSystems on a chip$xTesting 615 7$aElectrical & Computer Engineering 615 7$aEngineering & Applied Sciences 615 7$aElectrical Engineering 676 $a004.16 712 02$aIEEE Computer Society Technical Council on Test Technology. 712 02$aIEEE Xplore (Online service) 712 12$aInternational Workshop on Microprocessor Test and Verification 801 0$bPQKB 906 $aPROCEEDING 912 $a9910142739703321 996 $aSixth International Workshop on Microprocessor Test and Verification : common challenges and solutions : MTV 2005 : proceedings : Austin, Texas, 3-4 November, 2005$92379143 997 $aUNINA