LEADER 01200oam  2200349z- 450 
001 9910142706203321
005 20070818082434.0
010   $a1-5090-9088-6
035   $a(CKB)1000000000331244
035   $a(EXLCZ)991000000000331244
100   $a20220608c2006uuuu  -u-            -
101 0 $aeng
200 10$a2006 IEEE International Test Conference $eSanta Clara, CA : 22-27 October 2006
210   $cIEEE
311   $a1-4244-0291-3 
311   $a1-4244-0292-1 
517   $aAutonomic Computing 
517   $a2006 IEEE International Test Conference
606   $aIntegrated circuits$xTesting$vCongresses
606   $aElectronic digital computers$xCircuits$xTesting$vCongresses
606   $aTelecommunication$vCongresses
606   $aRadio frequency$vCongresses
615  0$aIntegrated circuits$xTesting
615  0$aElectronic digital computers$xCircuits$xTesting
615  0$aTelecommunication
615  0$aRadio frequency
676   $a621.3815/48
712 02$aInstitute of Electrical and Electronics Engineers.$bPhiladelphia Section.
906   $aPROCEEDING
912   $a9910142706203321
996   $a2006 IEEE International Test Conference$92875556
997   $aUNINA