LEADER 02053oam  2200517zu 450 
001 9910142656103321
005 20241212215424.0
010   $a9781509089147
010   $a1509089144
035   $a(CKB)1000000000331048
035   $a(SSID)ssj0000395464
035   $a(PQKBManifestationID)12128963
035   $a(PQKBTitleCode)TC0000395464
035   $a(PQKBWorkID)10455026
035   $a(PQKB)10360442
035   $a(EXLCZ)991000000000331048
100   $a20160829d2007      uy 
101 0 $aeng
181   $ctxt
182   $cc
183   $acr
200 10$aMSE 2007 : 2007 IEEE International Conference on Microelectronic Systems Education : proceedings : 3-4 June, 2007, San Diego, CA
210 31$a[Place of publication not identified]$cIEEE Computer Society$d2007
300   $aBibliographic Level Mode of Issuance: Monograph
311 08$a9780769528496 
311 08$a076952849X 
606   $aMicroelectronics$xStudy and teaching$vCongresses
606   $aIntegrated circuits$xDesign and construction$xStudy and teaching$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aMicroelectronics$xStudy and teaching
615  0$aIntegrated circuits$xDesign and construction$xStudy and teaching
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
676   $a621.381071
712 02$aIEEE Computer Society Technical Committee on VLSI,
712 02$aIEEE Computer Society Design Automation Technical Committee
712 02$aIEEE Computer Society Technical Council on Test Technology.
712 12$aIEEE International Conference on Microelectronic Systems Education
801  0$bPQKB
906   $aPROCEEDING
912   $a9910142656103321
996   $aMSE 2007 : 2007 IEEE International Conference on Microelectronic Systems Education : proceedings : 3-4 June, 2007, San Diego, CA$92392960
997   $aUNINA