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200 10$aDBT 2005 $eproceedings, 2005 IEEE International Workshop on Current and Defect Based Testing, 2005 : 1 May 2005
210  1$aNew York :$cIEEE,$d2005.
215   $a1 online resource (81 pages)
311   $a1-4244-0034-1 
606   $aIntegrated circuits$xDefects$vCongresses
606   $aIddq testing$vCongresses
606   $aMetal oxide semiconductors, Complementary$vCongresses
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615  0$aMetal oxide semiconductors, Complementary
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