LEADER 01396nam  2200373   450 
001 9910141899003321
005 20230803194741.0
010   $a1-4799-4006-2
035   $a(CKB)2560000000337429
035   $a(WaSeSS)IndRDA00119434
035   $a(EXLCZ)992560000000337429
100   $a20200304d2014      uy             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$a18th International Symposium on VLSI Design and Test $e16-18 July 2014, Coimbatore, India /$fInstitute of Electrical and Electronics Engineers
210  1$aPiscataway, New Jersey :$cInstitute of Electrical and Electronics Engineers,$d2014.
215   $a1 online resource (135 pages)
311   $a1-4799-5084-X 
311   $a1-4799-5088-2 
606   $aIntegrated circuitsngresses$xVery large scale integration$xDesign and construction$vCongresses
606   $aEmbedded computer systems$vCongresses
615  0$aIntegrated circuitsngresses$xVery large scale integration$xDesign and construction
615  0$aEmbedded computer systems
676   $a621.395
712 02$aInstitute of Electrical and Electronics Engineers,
801  0$bWaSeSS
801  1$bWaSeSS
906   $aPROCEEDING
912   $a9910141899003321
996   $a18th International Symposium on VLSI Design and Test$92528097
997   $aUNINA