LEADER 01235nam  2200361   450 
001 9910141756303321
005 20171018112146.0
010   $a0-7381-5722-8
035   $a(CKB)2670000000414802
035   $a(WaSeSS)IndRDA00079141
035   $a(NjHacI)992670000000414802
035   $a(EXLCZ)992670000000414802
100   $a20171018d2007      ||             |
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 00$aStandard for extensions to standard test interface language (STIL) for semiconductor design environments
210  1$aNew York :$cIEEE,$d2007.
215   $a1 online resource (93 pages)
311   $a2-8318-9348-8 
606   $aComputer hardware description languages$xStandards
606   $aIntegrated circuits$xTesting$xStandards
615  0$aComputer hardware description languages$xStandards.
615  0$aIntegrated circuits$xTesting$xStandards.
676   $a621.392
801  0$bWaSeSS
801  1$bWaSeSS
906   $aDOCUMENT
912   $a9910141756303321
996   $aStandard for extensions to standard test interface language (STIL) for semiconductor design environments$92581151
997   $aUNINA