LEADER 01401oam 2200445zu 450 001 9910140921603321 005 20241212220028.0 010 $a9780769542928 010 $a0769542921 035 $a(CKB)2670000000053984 035 $a(SSID)ssj0000452072 035 $a(PQKBManifestationID)12140709 035 $a(PQKBTitleCode)TC0000452072 035 $a(PQKBWorkID)10463945 035 $a(PQKB)11055566 035 $a(NjHacI)992670000000053984 035 $a(EXLCZ)992670000000053984 100 $a20160829d2010 uy 101 0 $aeng 135 $aur||||||||||| 181 $ctxt 182 $cc 183 $acr 200 10$a2010 IEEE 12th International Symposium on High-Assurance Systems Engineering 210 31$a[Place of publication not identified]$cI E E E$d2010 215 $a1 online resource (xiv, 172 pages) 300 $aBibliographic Level Mode of Issuance: Monograph 311 08$a9781424490912 311 08$a142449091X 606 $aReliability (Engineering)$vCongresses 606 $aComputer input-output equipment$vCongresses 615 0$aReliability (Engineering) 615 0$aComputer input-output equipment 676 $a621.3916 702 $aIEEE Staff 801 0$bPQKB 906 $aPROCEEDING 912 $a9910140921603321 996 $a2010 IEEE 12th International Symposium on High-Assurance Systems Engineering$92353264 997 $aUNINA