LEADER 01732oam  2200481zu 450 
001 9910140015403321
005 20241212215752.0
010   $a9781509075676
010   $a1509075674
035   $a(CKB)1000000000812143
035   $a(SSID)ssj0000396684
035   $a(PQKBManifestationID)12138651
035   $a(PQKBTitleCode)TC0000396684
035   $a(PQKBWorkID)10334461
035   $a(PQKB)10352073
035   $a(EXLCZ)991000000000812143
100   $a20160829d2009      uy 
101 0 $aeng
181   $ctxt
182   $cc
183   $acr
200 10$a2009 27th IEEE VLSI Test Symposium : proceedings : 3-7 May 2009 Santa Cruz, CA, USA ; VTS 2009
210 31$a[Place of publication not identified]$cIEEE Computer Society$d2009
300   $aBibliographic Level Mode of Issuance: Monograph
311 08$a9780769535982 
311 08$a0769535984 
606   $aIntegrated circuits$xVery large scale integration$xTesting$vCongresses
606   $aElectrical Engineering$2HILCC
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
615  0$aIntegrated circuits$xVery large scale integration$xTesting
615  7$aElectrical Engineering
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
676   $a621.39/5
712 02$aInstitute of Electrical and Electronics Engineers
712 02$aIEEE Computer Society Test Technology Technical Committee
712 12$aIEEE VLSI Test Symposium
801  0$bPQKB
906   $aPROCEEDING
912   $a9910140015403321
996   $a2009 27th IEEE VLSI Test Symposium : proceedings : 3-7 May 2009 Santa Cruz, CA, USA ; VTS 2009$92415234
997   $aUNINA