LEADER 01023nam0-22003011i-450- 001 990006393360403321 005 20140908194014.0 035 $a000639336 035 $aFED01000639336 035 $a(Aleph)000639336FED01 035 $a000639336 100 $a20000112d1992----km-y0itay50------ba 101 0 $aeng 102 $aIT 105 $a--------00-yy 200 1 $a<>firm as institution$erecent evolution in the contractual perspective$fLiliana Basile, Paola Casavola 210 $aNapoli$cUniversità degli studi di Napoli. Dipartimento di scienze economiche e sociali$d1992 215 $a32 p.$d24 cm 225 1 $aQuaderni del Dipartimento di scienze economiche e sociali, Università degli studi di Napoli Federico II$v5 700 1$aBasile,$bLiliana$0122819 701 1$aCasavola,$bPaola$083971 801 0$aIT$bUNINA$gRICA$2UNIMARC 901 $aBK 912 $a990006393360403321 952 $aXV C 242 (5)$b36359*$fFGBC 959 $aFGBC 996 $aFirm as institution$9660197 997 $aUNINA LEADER 06076nam 2200757 a 450 001 9910139612403321 005 20230725050917.0 010 $a1-119-97990-0 010 $a1-283-20457-6 010 $a9786613204578 010 $a1-119-97884-X 010 $a1-119-97885-8 035 $a(CKB)2550000000043053 035 $a(EBL)693217 035 $a(OCoLC)751695083 035 $a(SSID)ssj0000529387 035 $a(PQKBManifestationID)12200145 035 $a(PQKBTitleCode)TC0000529387 035 $a(PQKBWorkID)10552903 035 $a(PQKB)11124748 035 $a(MiAaPQ)EBC693217 035 $a(Au-PeEL)EBL693217 035 $a(CaPaEBR)ebr10488537 035 $a(CaONFJC)MIL320457 035 $a(EXLCZ)992550000000043053 100 $a20110510d2011 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 00$aAberration-corrected analytical transmission electron microscopy$b[electronic resource] /$fedited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks 210 $aHoboken, N.J. $cWiley$d2011 215 $a1 online resource (306 p.) 225 1 $aRMS - Royal Microscopical Society 300 $aDescription based upon print version of record 311 $a0-470-51851-0 320 $aIncludes bibliographical references and index. 327 $aAberration-Corrected Analytical Transmission Electron Microscopy; Contents; List of Contributors; Preface; 1 General Introduction to Transmission Electron Microscopy (TEM); 1.1 What TEM Offers; 1.2 Electron Scattering; 1.2.1 Elastic Scattering; 1.2.2 Inelastic Scattering; 1.3 Signals which could be Collected; 1.4 Image Computing; 1.4.1 Image Processing; 1.4.2 Image Simulation; 1.5 Requirements of a Specimen; 1.6 STEM Versus CTEM; 1.7 Two Dimensional and Three Dimensional Information; 2 Introduction to Electron Optics; 2.1 Revision of Microscopy with Visible Light and Electrons 327 $a2.2 Fresnel and Fraunhofer Diffraction2.3 Image Resolution; 2.4 Electron Lenses; 2.4.1 Electron Trajectories; 2.4.2 Aberrations; 2.5 Electron Sources; 2.6 Probe Forming Optics and Apertures; 2.7 SEM, TEM and STEM; 3 Development of STEM; 3.1 Introduction: Structural and Analytical Information in Electron Microscopy; 3.2 The Crewe Revolution: How STEM Solves the Information Problem; 3.3 Electron Optical Simplicity of STEM; 3.4 The Signal Freedom of STEM; 3.4.1 Bright-Field Detector (Phase Contrast, Diffraction Contrast); 3.4.2 ADF, HAADF; 3.4.3 Nanodiffraction; 3.4.4 EELS; 3.4.5 EDX 327 $a3.4.6 Other Techniques3.5 Beam Damage and Beam Writing; 3.6 Correction of Spherical Aberration; 3.7 What does the Future Hold?; 4 Lens Aberrations: Diagnosis and Correction; 4.1 Introduction; 4.2 Geometric Lens Aberrations and Their Classification; 4.3 Spherical Aberration-Correctors; 4.3.1 Quadrupole-Octupole Corrector; 4.3.2 Hexapole Corrector; 4.3.3 Parasitic Aberrations; 4.4 Getting Around Chromatic Aberrations; 4.5 Diagnosing Lens Aberrations; 4.5.1 Image-based Methods; 4.5.2 Ronchigram-based Methods; 4.5.3 Precision Needed; 4.6 Fifth Order Aberration-Correction; 4.7 Conclusions 327 $a5 Theory and Simulations of STEM Imaging5.1 Introduction; 5.2 Z-Contrast Imaging of Single Atoms; 5.3 STEM Imaging Of Crystalline Materials; 5.3.1 Bright-field Imaging and Phase Contrast; 5.3.2 Annular Dark-field Imaging; 5.4 Incoherent Imaging with Dynamical Scattering; 5.5 Thermal Diffuse Scattering; 5.5.1 Approximations for Phonon Scattering; 5.6 Methods of Simulation for ADF Imaging; 5.6.1 Absorptive Potentials; 5.6.2 Frozen Phonon Approach; 5.7 Conclusions; 6 Details of STEM; 6.1 Signal to Noise Ratio and Some of its Implications 327 $a6.2 The Relationships Between Probe Size, Probe Current and Probe Angle6.2.1 The Geometric Model Revisited; 6.2.2 The Minimum Probe Size, the Optimum Angle and the Probe Current; 6.2.3 The Probe Current; 6.2.4 A Simple Approximation to Wave Optical Probe Size; 6.2.5 The Effect of Chromatic Aberration; 6.2.6 Choosing aopt in Practice; 6.2.7 The Effect of Making a Small Error in the Choice of aopt; 6.2.8 The Effect of a On the Diffraction Pattern; 6.2.9 Probe Spreading and Depth of Field; 6.3 The Condenser System; 6.4 The Scanning System; 6.4.1 Principles of the Scanning System 327 $a6.4.2 Implementation of the Scanning System 330 $a"The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS)"--$cProvided by publisher. 330 $a"The book will be concerned with the theory, background and practical use of transmission electron microscopes with lens correctors which can correct for the effects of spherical aberration"--$cProvided by publisher. 410 0$aRMS - Royal Microscopical Society 606 $aTransmission electron microscopy 606 $aAberration 606 $aAchromatism 615 0$aTransmission electron microscopy. 615 0$aAberration. 615 0$aAchromatism. 676 $a502.8/25 676 $a502.825 686 $aSCI053000$2bisacsh 701 $aBrydson$b Rik$0961352 701 $aBrooks$b Susan$0961353 712 02$aRoyal Microscopical Society (Great Britain) 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910139612403321 996 $aAberration-corrected analytical transmission electron microscopy$92179570 997 $aUNINA