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010   $a9786613140685
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100   $a20780516d2011      uy             0
101 0 $aeng
135   $aur|n|---|||||
181   $ctxt
182   $cc
183   $acr
200 00$aAdvances in speckle metrology and related techniques$b[electronic resource] /$fedited by Guillermo H. Kaufmann
205   $a4th ed.
210   $aWeinheim $cWiley-VCH Verlag$dc2011
215   $a1 online resource (329 p.)
300   $aDescription based upon print version of record.
311   $a3-527-40957-2 
320   $aIncludes bibliographical references and index.
327   $aAdvances in Speckle Metrology and Related Techniques; Contents; Preface; List of Contributors; 1 Radial Speckle Interferometry and Applications; 2 Depth-Resolved Displacement Field Measurement; 3 Single-Image Interferogram Demodulation; 4 Phase Evaluation in Temporal Speckle Pattern Interferometry Using Time-Frequency Methods; 5 Optical Vortex Metrology; 6 Speckle Coding for Optical and Digital Data Security Applications; Index
330   $aSpeckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way. They have changed dramatically during the last years due to the development of modern optical components, with faster and more powerful digital computers, and novel data processing approaches. This most up-to-date overview of the topic describes new techniques developed in the field of speckle metrology over t
606   $aSpeckle metrology
606   $aOptical measurements
608   $aElectronic books.
615  0$aSpeckle metrology.
615  0$aOptical measurements.
676   $a621.36
701   $aKaufmann$b Guillermo H$0988628
801  0$bMiAaPQ
801  1$bMiAaPQ
801  2$bMiAaPQ
906   $aBOOK
912   $a9910139336703321
996   $aAdvances in speckle metrology and related techniques$92260626
997   $aUNINA