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101 0 $aeng
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181   $ctxt
182   $cc
183   $acr
200 10$a2010 International Conference on Microelectronic Test Structures
210 31$a[Place of publication not identified]$cI E E E$d2010
215   $a1 online resource $cillustrations
300   $aBibliographic Level Mode of Issuance: Monograph
311 08$a9781424469123 
311 08$a1424469120 
330   $aThis page or pages intentionally left blank.
606   $aElectronic apparatus and appliances$xTesting$vCongresses
606   $aIntegrated circuits$xTesting$vCongresses
615  0$aElectronic apparatus and appliances$xTesting
615  0$aIntegrated circuits$xTesting
676   $a621.3810287
702   $aIEEE Staff
801  0$bPQKB
906   $aPROCEEDING
912   $a9910139100503321
996   $a2010 International Conference on Microelectronic Test Structures$92537646
997   $aUNINA