LEADER 05338nam 2200673Ia 450 001 9910139077803321 005 20220117120927.0 010 $a1-283-59302-5 010 $a9786613905475 010 $a1-118-52086-6 010 $a1-118-52101-3 010 $a1-118-52104-8 035 $a(CKB)2560000000092792 035 $a(EBL)1016652 035 $a(OCoLC)811504024 035 $a(SSID)ssj0000712007 035 $a(PQKBManifestationID)11444705 035 $a(PQKBTitleCode)TC0000712007 035 $a(PQKBWorkID)10722131 035 $a(PQKB)10721409 035 $a(MiAaPQ)EBC1016652 035 $a(EXLCZ)992560000000092792 100 $a19980730d1999 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aX-ray fluorescence spectrometry$b[electronic resource] /$fRon Jenkins 205 $a2nd ed. 210 $aNew York $cWiley$dc1999 215 $a1 online resource (230 p.) 225 0 $aChemical analysis ;$vv. 152 300 $a"A Wiley-Interscience publication." 311 $a0-471-29942-1 320 $aIncludes bibliographical references and index. 327 $aX-Ray Fluorescence Spectrometry; CONTENTS; PREFACE TO THE FIRST EDITION; PREFACE TO THE SECOND EDITION; CUMULATIVE LISTING OF VOLUMES IN SERIES; CHAPTER 1 PRODUCTION AND PROPERTIES X-RAYS; 1.1 Introduction; 1.2 Continuous Radiation; 1.3 Characteristic Radiation; 1.4 Absorption of X-Rays; 1.5 Coherent and Incoherent Scattering; 1.6 Interference and Diffraction; Bibliography; CHAPTER 2 INDUSTRIAL APPLICATIONS OF X-RAYS; 2.1 Introduction; 2.2 Diagnostic Uses of X-Rays; 2.3 Tomography; 2.4 Level and Thickness Gauging; 2.5 X-Ray Thickness Gauging; 2.6 Nondestructive Testing 327 $a2.7 Security Screening Systems2.8 X-Ray Lithography; 2.9 X-Ray Astronomy; Bibliography; CHAPTER 3 X-RAY DIFFRACTION; 3.1 Use of X-Ray Diffraction to Study the Crystalline State; 3.2 The Powder Method; 3.3 Use of X-Ray Powder Cameras; 3.4 The Powder Diffractometer; 3.5 Qualitative Applications of the X-Ray Powder Method; 3.6 Quantitative Methods in X-Ray Powder Diffraction; 3.7 Other Applications of X-Ray Diffraction; Bibliography; CHAPTER 4 X-RAY SPECTRA; 4.1 Introduction; 4.2 Electron Configuration of the Elements; 4.3 Fluorescent Yield; 4.4 Relationship Between Wavelength and Atomic Number 327 $a4.5 Normal Transitions (Diagram Lines)4.6 Satellite Lines; 4.7 Characteristic Line Spectra; 4.8 K Spectra; 4.9 L Spectra; 4.10 M Spectra; Bibliography; CHAPTER 5 HISTORY AND DEVELOPMENT OF X-RAY FLUORESCENCE SPECTROMETRY; 5.1 Historical Development of X-Ray Spectrometry; 5.2 Early Ideas About X-Ray Fluorescence; 5.3 Rebirth of X-Ray Fluorescence; 5.4 Evolution of Hardware Control Methods; 5.5 The Growing Role of X-Ray Fluorescence Analysis in Industry and Research; 5.6 The Arrival of Energy Dispersive Spectrometry; 5.7 Evolution of Mathematical Correction Procedures 327 $a5.8 X-Ray Analysis in the 1970s5.9 More Recent Development of X-Ray Fluorescence; Bibliography; CHAPTER 6 INSTRUMENTATION FOR X-RAY SPECTROMETRY; 6.1 Introduction; 6.2 Excitation of X-Rays; 6.3 Detection of X-Rays; 6.4 Wavelength Dispersive Spectrometers; 6.5 Energy Dispersive Spectrometers; Bibliography; CHAPTER 7 COMPARISON OF WAVELENGTH AND ENERGY DISPERSIVE SPECTROMETERS; 7.1 Introduction; 7.2 The Measurable Atomic Number Range; 7.3 The Resolution of Lines; 7.4 Measurement of Low Concentrations; 7.5 Qualitative Analysis 327 $a7.6 Geometric Constraints of Wavelength and Energy Dispersive SpectrometersBibliography; CHAPTER 8 MORE RECENT TRENDS IN X-RAY FLUORESCENCE INSTRUMENTATION; 8.1 The Role of X-Ray Fluorescence in Industry and Research; 8.2 Scope of the X-Ray Fluorescence Method; 8.3 The Determination of Low Atomic Number Elements; 8.4 Total Reflection X-Ray Fluorescence; 8.5 Synchrotron Source X-Ray Fluorescence-SSXRF; 8.6 Proton Induced X-Ray Fluorescence; Bibliography; CHAPTER 9 SPECIMEN PREPARATION AND PRESENTATION; 9.1 Form of the Sample for X-Ray Analysis; 9.2 Direct Analysis of Solid Samples 327 $a9.3 Preparation of Powder Samples 330 $aX-ray fluorescence spectroscopy, one of the most powerful and flexible techniques available for the analysis and characterization of materials today, has gone through major changes during the past decade.Fully revised and expanded by 30%, X-Ray Fluorescence Spectrometry, Second Edition incorporates the latest industrial and scientific trends in all areas. It updates all previous material and adds new chapters on such topics as the history of X-ray fluorescence spectroscopy, the design of X-ray spectrometers, state-of-the-art applications, and X-ray spectra.Ron Jenkins draws on his exte 410 0$aChemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications 606 $aX-ray spectroscopy 606 $aFluorescence spectroscopy 608 $aElectronic books. 615 0$aX-ray spectroscopy. 615 0$aFluorescence spectroscopy. 676 $a543.08586 676 $a543.62 700 $aJenkins$b Ron$f1932-$052234 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910139077803321 996 $aX-ray fluorescence spectrometry$9766246 997 $aUNINA LEADER 01419nam 2200445 450 001 9910798706703321 005 20230807213050.0 010 $a93-86107-92-9 035 $a(CKB)3710000000897633 035 $a(MiAaPQ)EBC4699830 035 $a(Au-PeEL)EBL4699830 035 $a(CaPaEBR)ebr11275663 035 $a(OCoLC)960753642 035 $a(EXLCZ)993710000000897633 100 $a20161018h20152015 uy 0 101 0 $aeng 135 $aurcnu|||||||| 181 $2rdacontent 182 $2rdamedia 183 $2rdacarrier 200 00$aNew frontiers in plastic and cosmetic surgery /$feditors, Alberto Di Giuseppe, Melvin A Shiffman ; foreword Jose? Guerrerosantos 205 $aFirst edition. 210 1$aNew Delhi, [India] :$cJaypee, The Health Sciences Publishers,$d2015. 210 4$dİ2015 215 $a1 online resource (252 pages) $cillustrations, photographs 311 $a93-5152-776-X 320 $aIncludes bibliographical references at the end of each chapters and index. 606 $aSurgery, Plastic 615 0$aSurgery, Plastic. 676 $a617.95 702 $aDi Giuseppe$b Alberto 702 $aShiffman$b Melvin A. 702 $aGuerrerosantos$b Jose? 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910798706703321 996 $aNew frontiers in plastic and cosmetic surgery$93830209 997 $aUNINA