LEADER 01721oam 2200457zu 450 001 9910138915103321 005 20241212215827.0 035 $a(CKB)2400000000003077 035 $a(SSID)ssj0000526976 035 $a(PQKBManifestationID)12231672 035 $a(PQKBTitleCode)TC0000526976 035 $a(PQKBWorkID)10522667 035 $a(PQKB)11191793 035 $a(EXLCZ)992400000000003077 100 $a20160829d2009 uy 101 0 $aeng 181 $ctxt 182 $cc 183 $acr 200 10$aProceedings, 2009 Testing: Academic and Industrial Conference Practice and Research Techniques : TAIC PART 2009 : 4-6 September 2009 : [Cumberland Lodge], Windsor, United Kingdom 210 31$a[Place of publication not identified]$cIEEE Computer Society$d2009 300 $aBibliographic Level Mode of Issuance: Monograph 311 08$a9781424449774 311 08$a1424449774 311 08$a9780769538204 311 08$a0769538207 606 $aComputer software$xTesting$vCongresses 606 $aEngineering & Applied Sciences$2HILCC 606 $aComputer Science$2HILCC 615 0$aComputer software$xTesting 615 7$aEngineering & Applied Sciences 615 7$aComputer Science 676 $a005.3028/7 712 02$aIEEE Computer Society, 712 02$aInstitute of Electrical and Electronics Engineers, 712 12$aTesting: Academic & Industrial Conference--Practice and Research Techniques. 801 0$bPQKB 906 $aPROCEEDING 912 $a9910138915103321 996 $aProceedings, 2009 Testing: Academic and Industrial Conference Practice and Research Techniques : TAIC PART 2009 : 4-6 September 2009 : , Windsor, United Kingdom$92419788 997 $aUNINA