LEADER 05356nam 2200625 450 001 9910138857103321 005 20200520144314.0 010 $a1-118-72304-X 010 $a1-118-72311-2 010 $a1-118-72314-7 035 $a(CKB)2550000001138877 035 $a(EBL)1483726 035 $a(OCoLC)861559387 035 $a(OCoLC)868954409 035 $a(MiAaPQ)EBC1483726 035 $a(Au-PeEL)EBL1483726 035 $a(CaPaEBR)ebr10788041 035 $a(CaONFJC)MIL538547 035 $a(PPN)221544364 035 $a(EXLCZ)992550000001138877 100 $a20131107d2014 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $2rdacontent 182 $2rdamedia 183 $2rdacarrier 200 00$aScanning probe microscopy for industrial applications $enanomechanical characterization /$fedited by Dalia G. Yablon 210 1$aHoboken, New Jersey :$cWiley,$d2014. 210 4$dİ2014 215 $a1 online resource (385 p.) 300 $aDescription based upon print version of record. 311 $a1-118-28823-8 311 $a1-306-07296-4 320 $aIncludes bibliographical references at the end of each chapters and index. 327 $aScanning Probe Microscopy in Industrial Applications: Nanomechanical Characterization; Copyright; Contents; Contributors List; Preface; Acknowledgments; Chapter 1 Overview of Atomic Force Microscopy; 1.1 A Word on Nomenclature; 1.2 Atomic Force Microscopy-The Appeal to Industrial R&D; 1.3 Mechanical Properties; 1.4 Overview of AFM Operation; 1.4.1 AFM Hardware; 1.4.2 Cantilevers and Probes; 1.4.3 Optical Detection System; 1.4.4 x-y-z Scanner; 1.4.5 AFM Software; 1.4.6 Calibrations; 1.4.7 Cantilever Spring Constant; 1.4.8 Tip Shape Calibration; 1.5 Nanomechanical Methods Surveyed in Book 327 $a1.6 Industries RepresentedAcknowledgments; References; Chapter 2 Understanding the Tip-Sample Contact: An Overview of Contact Mechanics from the Macro- to the Nanoscale; 2.1 Hertz Equations for Elastic Contact; 2.1.1 Introduction; 2.1.2 Hertz Equations; 2.1.3 Assumptions of Hertz model; 2.1.4 Worked Examples: Hertz Mechanics of Diamond Tips on Stiff and Compliant Substrates; 2.2 Adhesive Contacts; 2.2.1 introduction to Adhesion; 2.2.2 Basic Physics and Mathematics of Surface Interactions; 2.2.3 Derjaguin-Mu?ller-Toporov and Johnson-Kendall-Roberts Models of Adhesion 327 $a2.2.4 More Realistic Picture of Adhesion2.2.5 Continuing the Worked Examples: Adding Adhesion to Diamond Tips on Stiff and Compliant Substrates; 2.3 Further Extensions of Continuum Contact Mechanics Models; 2.3.1 Tip Shape Differs from a Paraboloid; 2.3.2 Flattened Tip Shapes; 2.3.3 Axisymmetric Power Law Tip Shapes; 2.3.4 Anisotropic Elasticity, Viscoelastic, and Plastic Effects; 2.4 Thin Films; 2.5 Tangential Forces; 2.5.1 Three Possible Cases for a Tangentially Loaded Contact; 2.5.2 Active Debate over the Behavior of the Shear Stress; 2.5.3 Lateral Stiffness 327 $a2.6 Application of Continuum Mechanics to Nanoscale Contacts2.6.1 Unique Considerations of Nanoscale Contacts; 2.6.2 Evidence of Applicability of Continuum Contact Mechanics at the Nanoscale; Acknowledgments; APPENDIX 2A Surface Energy and Work of Adhesion; References; Chapter 3 Understanding Surface Forces Using Static and Dynamic Approach-Retraction Curves; 3.1 Tip-Sample Interaction Forces; 3.1.1 Piecewise Linear Contact; 3.1.2 Piecewise Linear Attractive-Repulsive Contact; 3.1.3 Lennard-Jones Potential; 3.1.4 Derjaguin-Mu?ller-Toporov + van der Waals Model; 3.1.5 Viscoelastic Forces 327 $a3.1.6 Capillary Forces3.2 Static F-Z Curves; 3.2.1 Conversion of F-Z Curves into F-d Curves; 3.2.2 Examples from Literature; 3.2.3 Uncertainties and Sources of Error; 3.3 Dynamic Amplitude/Phase-Distance Curves; 3.3.1 Theory; 3.3.2 Interpreting the Virial; 3.3.3 Physics of Amplitude Reduction; 3.3.4 Attractive and Repulsive Regimes of Interaction; 3.3.5 Reconstruction of Forces; 3.4 Brief Guide to VEDA Simulations; 3.4.1 F-Z Curve Tutorial; 3.4.2 Amplitude/Phase-Distance Curves Tutorial; 3.4.3 Advanced Amplitude/Phase-Distance Curves Tutorial; 3.5 Conclusions; Glossary; References 327 $aChapter 4 Phase Imaging 330 $a Describes new state-of-the-science tools and their contribution to industrial R&D With contributions from leading international experts in the field, this book explains how scanning probe microscopy is used in industry, resulting in improved product formulation, enhanced processes, better quality control and assurance, and new business opportunities. Readers will learn about the use of scanning probe microscopy to support R&D efforts in the semiconductor, chemical, personal care product, biomaterial, pharmaceutical, and food science industries, among others. Scanning Probe 606 $aMaterials$xMicroscopy 606 $aScanning probe microscopy$xIndustrial applications 615 0$aMaterials$xMicroscopy. 615 0$aScanning probe microscopy$xIndustrial applications. 676 $a620.1/127 686 $aTEC027000$2bisacsh 701 $aYablon$b Dalia G.$f1975-$0901601 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910138857103321 996 $aScanning probe microscopy for industrial applications$92015195 997 $aUNINA