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005 20180305182253.0
010   $a1-5090-7533-X
035   $a(CKB)2400000000002609
035   $a(WaSeSS)IndRDA00093456
035   $a(EXLCZ)992400000000002609
100   $a20180305d2009      ||             |
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 14$aThe IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems $eproceedings : Chicago, Illinois, 7-9 October 2009 /$fedited by Dimitris Gizopoulos, Mohammad Tehranipoor, and Spyros Tragoudas ; sponsored by the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, the IEEE Test Technology Technical Council
210  1$aNew York :$cIEEE,$d2009.
215   $a1 online resource (xxxi, 455 pages)
300   $aIncludes index.
311   $a0-7695-3839-8 
606   $aFault-tolerant computing$vCongresses
606   $aIntegrated circuits$xVery large scale integration$xDesign and construction$vCongresses
615  0$aFault-tolerant computing
615  0$aIntegrated circuits$xVery large scale integration$xDesign and construction
702   $aGizopoulos$b Dimitris
702   $aTehranipoor$b Mohammad H.$f1974-
702   $aTragoudas$b Spyros
712 02$aIEEE Computer Society.$bFault-Tolerant Computing Technical Committee,
712 02$aIEEE Computer Society.$bTechnical Council on Test Technology,
801  0$bWaSeSS
801  1$bWaSeSS
906   $aPROCEEDING
912   $a9910138783103321
996   $aThe IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems$92368158
997   $aUNINA